Real-time FPGA-LabVIEW homebuilt system for noise reduction in AFM imaging.

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Title: Real-time FPGA-LabVIEW homebuilt system for noise reduction in AFM imaging.
Authors: SUN, Qiuyuan1,2,3, YAO, Zhifei1,2,4, SUN, Jianheng1,2,3, ZHAO, Bohui1,2,4, ZHANG, Ketong1,2,3, YAO, Haoran1,2,3, WEI, Jiuyan1,2,3, WEN, Huanfei1,2,4, TANG, Jun1,2,3, MA, Zongmin1,2,3 mzmncit@163.com, LIU, Jun1,2,4
Source: Journal of Measurement Science & Instrumentation. Jun2026, Vol. 17 Issue 2, p355-366. 12p.
Subjects: Atomic force microscopy, Field programmable gate arrays, Real-time computing, LabVIEW (Computer software), Noise control, Signal-to-noise ratio, Vibration tests, Digital electric filters
Abstract: Atomic force microscopy (AFM) probe vibration monitoring is essential for achieving accurate nanoscale imaging and reliable signal interpretation. This paper presents a low-noise vibration detection method based on a real-time FPGA-LabVIEW homebuilt system. The FPGA receives signals from a quadrant photodiode (QPD), performs analog-to-digital conversion and parallel processing, and integrates cascaded digital filters for noise reduction. A finite impulse response (FIR) low-pass filter extracts the static spot position, while an infinite impulse response (IIR) band-pass filter preserves the probe's resonance vibrations. Compared with conventional analog detection, the proposed system reduces background noise by approximately 50% (measured as 50.23%), enhances the signal-to-noise ratio (SNR) from 15 dB to 20 dB, and maintains FPGA signal-processing latency below 5 µs. This work demonstrates that the proposed real-time FPGA-LabVIEW AFM noise optimization system significantly improves signal-to-noise ratio and real-time performance, providing a practical solution for high-precision, low-noise AFM imaging. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Measurement Science & Instrumentation is the property of Journal of Measurement Science & Instrumentation and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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DbLabel: Engineering Source
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  Data: Real-time FPGA-LabVIEW homebuilt system for noise reduction in AFM imaging.
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  Data: <searchLink fieldCode="AR" term="%22SUN%2C+Qiuyuan%22">SUN, Qiuyuan</searchLink><relatesTo>1,2,3</relatesTo><br /><searchLink fieldCode="AR" term="%22YAO%2C+Zhifei%22">YAO, Zhifei</searchLink><relatesTo>1,2,4</relatesTo><br /><searchLink fieldCode="AR" term="%22SUN%2C+Jianheng%22">SUN, Jianheng</searchLink><relatesTo>1,2,3</relatesTo><br /><searchLink fieldCode="AR" term="%22ZHAO%2C+Bohui%22">ZHAO, Bohui</searchLink><relatesTo>1,2,4</relatesTo><br /><searchLink fieldCode="AR" term="%22ZHANG%2C+Ketong%22">ZHANG, Ketong</searchLink><relatesTo>1,2,3</relatesTo><br /><searchLink fieldCode="AR" term="%22YAO%2C+Haoran%22">YAO, Haoran</searchLink><relatesTo>1,2,3</relatesTo><br /><searchLink fieldCode="AR" term="%22WEI%2C+Jiuyan%22">WEI, Jiuyan</searchLink><relatesTo>1,2,3</relatesTo><br /><searchLink fieldCode="AR" term="%22WEN%2C+Huanfei%22">WEN, Huanfei</searchLink><relatesTo>1,2,4</relatesTo><br /><searchLink fieldCode="AR" term="%22TANG%2C+Jun%22">TANG, Jun</searchLink><relatesTo>1,2,3</relatesTo><br /><searchLink fieldCode="AR" term="%22MA%2C+Zongmin%22">MA, Zongmin</searchLink><relatesTo>1,2,3</relatesTo><i> mzmncit@163.com</i><br /><searchLink fieldCode="AR" term="%22LIU%2C+Jun%22">LIU, Jun</searchLink><relatesTo>1,2,4</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Measurement+Science+%26+Instrumentation%22">Journal of Measurement Science & Instrumentation</searchLink>. Jun2026, Vol. 17 Issue 2, p355-366. 12p.
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  Data: <searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Field+programmable+gate+arrays%22">Field programmable gate arrays</searchLink><br /><searchLink fieldCode="DE" term="%22Real-time+computing%22">Real-time computing</searchLink><br /><searchLink fieldCode="DE" term="%22LabVIEW+%28Computer+software%29%22">LabVIEW (Computer software)</searchLink><br /><searchLink fieldCode="DE" term="%22Noise+control%22">Noise control</searchLink><br /><searchLink fieldCode="DE" term="%22Signal-to-noise+ratio%22">Signal-to-noise ratio</searchLink><br /><searchLink fieldCode="DE" term="%22Vibration+tests%22">Vibration tests</searchLink><br /><searchLink fieldCode="DE" term="%22Digital+electric+filters%22">Digital electric filters</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Atomic force microscopy (AFM) probe vibration monitoring is essential for achieving accurate nanoscale imaging and reliable signal interpretation. This paper presents a low-noise vibration detection method based on a real-time FPGA-LabVIEW homebuilt system. The FPGA receives signals from a quadrant photodiode (QPD), performs analog-to-digital conversion and parallel processing, and integrates cascaded digital filters for noise reduction. A finite impulse response (FIR) low-pass filter extracts the static spot position, while an infinite impulse response (IIR) band-pass filter preserves the probe's resonance vibrations. Compared with conventional analog detection, the proposed system reduces background noise by approximately 50% (measured as 50.23%), enhances the signal-to-noise ratio (SNR) from 15 dB to 20 dB, and maintains FPGA signal-processing latency below 5 µs. This work demonstrates that the proposed real-time FPGA-LabVIEW AFM noise optimization system significantly improves signal-to-noise ratio and real-time performance, providing a practical solution for high-precision, low-noise AFM imaging. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Measurement Science & Instrumentation is the property of Journal of Measurement Science & Instrumentation and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.62756/jmsi.1674-8042.2026030
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      – Code: eng
        Text: English
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        PageCount: 12
        StartPage: 355
    Subjects:
      – SubjectFull: Atomic force microscopy
        Type: general
      – SubjectFull: Field programmable gate arrays
        Type: general
      – SubjectFull: Real-time computing
        Type: general
      – SubjectFull: LabVIEW (Computer software)
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      – SubjectFull: Noise control
        Type: general
      – SubjectFull: Signal-to-noise ratio
        Type: general
      – SubjectFull: Vibration tests
        Type: general
      – SubjectFull: Digital electric filters
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      – TitleFull: Real-time FPGA-LabVIEW homebuilt system for noise reduction in AFM imaging.
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            NameFull: SUN, Qiuyuan
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              M: 06
              Text: Jun2026
              Type: published
              Y: 2026
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