Contact engineering of p-type CuI thin films: interplay of work function alignment and interfacial chemical stability. - Yang, Zhong-ao; Yang, Jia-lin; Yu, Qiu-fei; Chen, Xiao-jian; Xiao, Yi-fan; Zhu, Zhi-wei; Ji, Zhuo-ran; Zhao, Jun-liang; Yang, Chang (Journal of Physics D: Applied Physics, 2026)