Evolution of TIR–based ORQPM technique of frequency conversion: A state–of–the–art review.
Saved in:
| Title: | Evolution of TIR–based ORQPM technique of frequency conversion: A state–of–the–art review. |
|---|---|
| Authors: | Saha, Moumita1 (AUTHOR) er.moumitasaha@gmail.com, Deb, Sumita2 (AUTHOR) |
| Source: | Journal of Nonlinear Optical Physics & Materials. Jun2026, Vol. 35 Issue 4, p1-30. 30p. |
| Subjects: | Optical frequency conversion, Total internal reflection (Optics), Nonlinear optical materials, Optical polarization |
| Abstract: | The total-internal-reflection-based optical rotation quasi-phase-matching technique (TIR-ORQPM) has been successfully applied to the electro-optic chiral material for optical frequency transfiguration. Recently, a significant advancement has emerged in ORQPM technique by incorporating the TIR process. This paper reviews the current technological breakthroughs in the ORQPM approach, which are furnished mainly by our group. The input radiation could be injected on demand by employing TIR-ORQPM processes inside a single nonlinear optical crystal. ORQPM devices can serve as a key element in the frequency conversion process, solving many of the issues associated with the conventional QPM approach. The study is complemented by a juxtaposed evaluation of the produced linearly and elliptically polarized radiations for different frequency analyses. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Nonlinear Optical Physics & Materials is the property of World Scientific Publishing Company and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
Be the first to leave a comment!
