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Fabrication of curved-line nanostructures on membranes for transmission electron microscopy investigations of domain walls

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Title: Fabrication of curved-line nanostructures on membranes for transmission electron microscopy investigations of domain walls
Authors: Backes, D.1,2 dirk.backes@psi.ch, Heyderman, L.J.1, David, C.1, Schäublin, R.3, Kläui, M.2, Ehrke, H.2,4, Rüdiger, U.2, Vaz, C.A.F.5, Bland, J.A.C.5, Kasama, T.4,6, Dunin-Borkowski, R.E.4,6
Source: Microelectronic Engineering. Apr-Sep2006, Vol. 83 Issue 4-9, p1726-1729. 4p.
Subjects: Ferromagnetic materials, Transmission electron microscopy, Electron beam lithography, Electromagnetic induction
Abstract: Abstract: We have fabricated curved-line ferromagnetic nanostructures on membranes for transmission electron microscopy investigations of the equilibrium magnetic spin configurations. The magnetic elements were fabricated using electron-beam lithography and a lift-off procedure for pattern transfer. Due to the fragile nature of the membranes, the design of the elements was chosen to ensure that the lift-off was possible without using ultrasound. The elements included three-quarter rings, zig-zag lines and wavy lines with notches resulting in constrictions with widths down to 30nm. Magnetic configurations were observed using electron holography and Lorentz microscopy. In particular, the details of the spin structure of vortex and transverse walls, and its dependence on the local geometry were obtained. While Lorentz microscopy provided qualitative information about magnetic spin orientations and the positions of domain walls, electron holography gave quantitative high-resolution images of the magnetic induction allowing the direct measurement of the stray field between adjacent domain walls. [Copyright &y& Elsevier]
Copyright of Microelectronic Engineering is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 20574762
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Fabrication of curved-line nanostructures on membranes for transmission electron microscopy investigations of domain walls
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  Data: <searchLink fieldCode="AR" term="%22Backes%2C+D%2E%22">Backes, D.</searchLink><relatesTo>1,2</relatesTo><i> dirk.backes@psi.ch</i><br /><searchLink fieldCode="AR" term="%22Heyderman%2C+L%2EJ%2E%22">Heyderman, L.J.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22David%2C+C%2E%22">David, C.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Schäublin%2C+R%2E%22">Schäublin, R.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Kläui%2C+M%2E%22">Kläui, M.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Ehrke%2C+H%2E%22">Ehrke, H.</searchLink><relatesTo>2,4</relatesTo><br /><searchLink fieldCode="AR" term="%22Rüdiger%2C+U%2E%22">Rüdiger, U.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Vaz%2C+C%2EA%2EF%2E%22">Vaz, C.A.F.</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AR" term="%22Bland%2C+J%2EA%2EC%2E%22">Bland, J.A.C.</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AR" term="%22Kasama%2C+T%2E%22">Kasama, T.</searchLink><relatesTo>4,6</relatesTo><br /><searchLink fieldCode="AR" term="%22Dunin-Borkowski%2C+R%2EE%2E%22">Dunin-Borkowski, R.E.</searchLink><relatesTo>4,6</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Microelectronic+Engineering%22">Microelectronic Engineering</searchLink>. Apr-Sep2006, Vol. 83 Issue 4-9, p1726-1729. 4p.
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  Data: <searchLink fieldCode="DE" term="%22Ferromagnetic+materials%22">Ferromagnetic materials</searchLink><br /><searchLink fieldCode="DE" term="%22Transmission+electron+microscopy%22">Transmission electron microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+beam+lithography%22">Electron beam lithography</searchLink><br /><searchLink fieldCode="DE" term="%22Electromagnetic+induction%22">Electromagnetic induction</searchLink>
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  Data: Abstract: We have fabricated curved-line ferromagnetic nanostructures on membranes for transmission electron microscopy investigations of the equilibrium magnetic spin configurations. The magnetic elements were fabricated using electron-beam lithography and a lift-off procedure for pattern transfer. Due to the fragile nature of the membranes, the design of the elements was chosen to ensure that the lift-off was possible without using ultrasound. The elements included three-quarter rings, zig-zag lines and wavy lines with notches resulting in constrictions with widths down to 30nm. Magnetic configurations were observed using electron holography and Lorentz microscopy. In particular, the details of the spin structure of vortex and transverse walls, and its dependence on the local geometry were obtained. While Lorentz microscopy provided qualitative information about magnetic spin orientations and the positions of domain walls, electron holography gave quantitative high-resolution images of the magnetic induction allowing the direct measurement of the stray field between adjacent domain walls. [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Microelectronic Engineering is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.mee.2006.01.216
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              Text: Apr-Sep2006
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