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Microstructural study of binary TiO2:SiO2 nanocrystalline thin films

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Title: Microstructural study of binary TiO2:SiO2 nanocrystalline thin films
Authors: Mei, F.1, Liu, C.1 cliu@acc-lab.whu.edu.cn, Zhang, L.1, Ren, F.1, Zhou, L.2, Zhao, W.K.2, Fang, Y.L.2
Source: Journal of Crystal Growth. Jun2006, Vol. 292 Issue 1, p87-91. 5p.
Subjects: Thin films, Electron microscopes, Solid state electronics, Thick films
Abstract: Abstract: TiO2:SiO2 nanocrystalline thin films with high photocatalytic activities have been prepared at 35°C using liquid phase deposition. The microstructural properties of the thin films were characterized by ultraviolet-visible spectrophotometer, X-ray photoelectron spectroscopy, scanning electron microscope and transmission electron microscope. The photocatalytic performance of the thin films was evaluated by analyzing photocatalytic degradation of methylene blue. The results show that most TiO2 crystallites have been deposited on the top of SiO2 nanopowders, resulting in an improved photocatalytic efficiency through increasing the effective absorptive sites. [Copyright &y& Elsevier]
Copyright of Journal of Crystal Growth is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 21495926
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Microstructural study of binary TiO<subscript>2</subscript>:SiO<subscript>2</subscript> nanocrystalline thin films
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Crystal+Growth%22">Journal of Crystal Growth</searchLink>. Jun2006, Vol. 292 Issue 1, p87-91. 5p.
– Name: Subject
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  Data: <searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+microscopes%22">Electron microscopes</searchLink><br /><searchLink fieldCode="DE" term="%22Solid+state+electronics%22">Solid state electronics</searchLink><br /><searchLink fieldCode="DE" term="%22Thick+films%22">Thick films</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Abstract: TiO2:SiO2 nanocrystalline thin films with high photocatalytic activities have been prepared at 35°C using liquid phase deposition. The microstructural properties of the thin films were characterized by ultraviolet-visible spectrophotometer, X-ray photoelectron spectroscopy, scanning electron microscope and transmission electron microscope. The photocatalytic performance of the thin films was evaluated by analyzing photocatalytic degradation of methylene blue. The results show that most TiO2 crystallites have been deposited on the top of SiO2 nanopowders, resulting in an improved photocatalytic efficiency through increasing the effective absorptive sites. [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Crystal Growth is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.jcrysgro.2006.04.084
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      – Code: eng
        Text: English
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      – SubjectFull: Electron microscopes
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      – SubjectFull: Solid state electronics
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              Text: Jun2006
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