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Recent GridPix results: An integrated Micromegas grid and an ageing test of a Micromegas chamber

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Title: Recent GridPix results: An integrated Micromegas grid and an ageing test of a Micromegas chamber
Authors: van der Graaf, H. vdgraaf@nikhef.nl, Aarts, A.A.1, Chefdeville, M.1, van der Putten, S.1
Source: Nuclear Instruments & Methods in Physics Research Section A. Oct2006, Vol. 566 Issue 1, p62-65. 4p.
Subjects: Gas detectors, Integrated circuits, Semiconductor wafers, X-rays
Abstract: Abstract: We have constructed a new gas-filled detector in which we combine a Micromegas with a CMOS pixel chip. In a next step, a procedure to construct a Micromegas-like grid onto a Si wafer, using chip production technology (‘wafer post processing’), has been developed. An ageing test of a Micromegas chamber has been carried out. After verifying the chamber''s proportionality at a very high dose rate of X-rays, we irradiated the device until ageing became apparent. [Copyright &y& Elsevier]
Copyright of Nuclear Instruments & Methods in Physics Research Section A is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 22462825
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Recent GridPix results: An integrated Micromegas grid and an ageing test of a Micromegas chamber
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  Data: <searchLink fieldCode="AR" term="%22van+der+Graaf%2C+H%2E%22">van der Graaf, H.</searchLink><i> vdgraaf@nikhef.nl</i><br /><searchLink fieldCode="AR" term="%22Aarts%2C+A%2EA%2E%22">Aarts, A.A.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Chefdeville%2C+M%2E%22">Chefdeville, M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22van+der+Putten%2C+S%2E%22">van der Putten, S.</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Nuclear+Instruments+%26+Methods+in+Physics+Research+Section+A%22">Nuclear Instruments & Methods in Physics Research Section A</searchLink>. Oct2006, Vol. 566 Issue 1, p62-65. 4p.
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  Data: <searchLink fieldCode="DE" term="%22Gas+detectors%22">Gas detectors</searchLink><br /><searchLink fieldCode="DE" term="%22Integrated+circuits%22">Integrated circuits</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductor+wafers%22">Semiconductor wafers</searchLink><br /><searchLink fieldCode="DE" term="%22X-rays%22">X-rays</searchLink>
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  Data: Abstract: We have constructed a new gas-filled detector in which we combine a Micromegas with a CMOS pixel chip. In a next step, a procedure to construct a Micromegas-like grid onto a Si wafer, using chip production technology (‘wafer post processing’), has been developed. An ageing test of a Micromegas chamber has been carried out. After verifying the chamber''s proportionality at a very high dose rate of X-rays, we irradiated the device until ageing became apparent. [Copyright &y& Elsevier]
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  Data: <i>Copyright of Nuclear Instruments & Methods in Physics Research Section A is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.nima.2006.05.136
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        Text: English
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        Type: general
      – SubjectFull: Integrated circuits
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      – SubjectFull: Semiconductor wafers
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      – SubjectFull: X-rays
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      – TitleFull: Recent GridPix results: An integrated Micromegas grid and an ageing test of a Micromegas chamber
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              Text: Oct2006
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