Bibliographic Details
| Title: |
Monte-Carlo yield analysis. |
| Authors: |
Johnson, M.W., Herr, Q.P. |
| Source: |
IEEE Transactions on Applied Superconductivity. Jun99 Part 3 of 3, Vol. 9 Issue 2, p3322. 4p. 1 Diagram, 5 Graphs. |
| Subjects: |
Digital electronics, Josephson effect, Monte Carlo method |
| Abstract: |
Discusses the use of Monte Carlo methods in the analyses of digital circuit and Josephson circuit yields. Yield integration using importance sampling; Incorporation of the MALT algorithm. |
| Database: |
Engineering Source |
