Identification of nonlinear recording error in phase shifting interferometry
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| Title: | Identification of nonlinear recording error in phase shifting interferometry |
|---|---|
| Authors: | Styk, Adam1, Patorski, Krzysztof k.patorski@mchtr.pw.edu.pl |
| Source: | Optics & Lasers in Engineering. Feb2007, Vol. 45 Issue 2, p265-273. 9p. |
| Subjects: | Phase shift (Nuclear physics), Scattering (Physics), Optical measurements, Optical transfer function |
| Abstract: | Abstract: The phase shifting method for quantitative fringe pattern analysis provides high accuracy if stringent requirements on the component interferogram recording are met. In the paper the issue of detection and identification of error sources in the two-beam interferogram phase shifting experiment is discussed. The phase shift angle histogram and lattice-site representation are applied for that purpose. Special attention is paid to possible nonlinear recording of component interferograms in the presence of linear and nonlinear phase step errors. Four and five step phase shifting algorithms are considered. The superiority of the lattice-site representation is shown. In the case of phase steps equal to π/2, however, the lattice-site representation of shift angles for five frame algorithm does not allow to detect recording nonlinearity. The four frame counterpart shows to be very helpful in this respect. Its properties related to the fringe pattern profile under study, including a defocused Ronchi grating, are discussed. [Copyright &y& Elsevier] |
| Copyright of Optics & Lasers in Engineering is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 22938872 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Identification of nonlinear recording error in phase shifting interferometry – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Styk%2C+Adam%22">Styk, Adam</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Patorski%2C+Krzysztof%22">Patorski, Krzysztof</searchLink><i> k.patorski@mchtr.pw.edu.pl</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Optics+%26+Lasers+in+Engineering%22">Optics & Lasers in Engineering</searchLink>. Feb2007, Vol. 45 Issue 2, p265-273. 9p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Phase+shift+%28Nuclear+physics%29%22">Phase shift (Nuclear physics)</searchLink><br /><searchLink fieldCode="DE" term="%22Scattering+%28Physics%29%22">Scattering (Physics)</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+measurements%22">Optical measurements</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+transfer+function%22">Optical transfer function</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Abstract: The phase shifting method for quantitative fringe pattern analysis provides high accuracy if stringent requirements on the component interferogram recording are met. In the paper the issue of detection and identification of error sources in the two-beam interferogram phase shifting experiment is discussed. The phase shift angle histogram and lattice-site representation are applied for that purpose. Special attention is paid to possible nonlinear recording of component interferograms in the presence of linear and nonlinear phase step errors. Four and five step phase shifting algorithms are considered. The superiority of the lattice-site representation is shown. In the case of phase steps equal to π/2, however, the lattice-site representation of shift angles for five frame algorithm does not allow to detect recording nonlinearity. The four frame counterpart shows to be very helpful in this respect. Its properties related to the fringe pattern profile under study, including a defocused Ronchi grating, are discussed. [Copyright &y& Elsevier] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Optics & Lasers in Engineering is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.optlaseng.2005.12.010 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 9 StartPage: 265 Subjects: – SubjectFull: Phase shift (Nuclear physics) Type: general – SubjectFull: Scattering (Physics) Type: general – SubjectFull: Optical measurements Type: general – SubjectFull: Optical transfer function Type: general Titles: – TitleFull: Identification of nonlinear recording error in phase shifting interferometry Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Styk, Adam – PersonEntity: Name: NameFull: Patorski, Krzysztof IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 02 Text: Feb2007 Type: published Y: 2007 Identifiers: – Type: issn-print Value: 01438166 Numbering: – Type: volume Value: 45 – Type: issue Value: 2 Titles: – TitleFull: Optics & Lasers in Engineering Type: main |
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