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Simultaneous measurement of several near-parallel surfaces with wavelength-shifting interferometry and a tunable phase-shifting method

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Title: Simultaneous measurement of several near-parallel surfaces with wavelength-shifting interferometry and a tunable phase-shifting method
Authors: Burke, Jan1, Hibino, Kenichi2, Hanayama, Ryohei3, Oreb, Bozenko F.1
Source: Optics & Lasers in Engineering. Feb2007, Vol. 45 Issue 2, p326-341. 16p.
Subjects: Optical measurements, Spectrum analysis, Interferometry, Optics
Abstract: Abstract: Wavelength-shifting interferometry can distinguish in frequency space interference signals from different surfaces, and therefore allows the measurement of optical thickness variation between several quasi-parallel surfaces of a composite transparent object. Frequency analysis of the signal spectrum with a tunable phase-shifting formula can then detect the phase of the individual signals. We have devised a tunable phase-shifting method which uses a freely adjustable number of intensity samples and can be adapted to any frequency spectrum. To extract the signal reliably, two properties of the phase-shifting method are particularly important: it should suppress cross-talk from unwanted frequencies, and it should allow for some variation in the signal frequency. We show that a carefully designed sampling function envelope will combine these benefits, and demonstrate the technique in measurements of three different composite objects each consisting of three reflecting surfaces. The importance of phase-shift linearisation is discussed, and methods for selecting optimal set-up parameters are given. [Copyright &y& Elsevier]
Copyright of Optics & Lasers in Engineering is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 22938879
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Simultaneous measurement of several near-parallel surfaces with wavelength-shifting interferometry and a tunable phase-shifting method
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  Data: <searchLink fieldCode="JN" term="%22Optics+%26+Lasers+in+Engineering%22">Optics & Lasers in Engineering</searchLink>. Feb2007, Vol. 45 Issue 2, p326-341. 16p.
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  Data: <searchLink fieldCode="DE" term="%22Optical+measurements%22">Optical measurements</searchLink><br /><searchLink fieldCode="DE" term="%22Spectrum+analysis%22">Spectrum analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Interferometry%22">Interferometry</searchLink><br /><searchLink fieldCode="DE" term="%22Optics%22">Optics</searchLink>
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  Data: Abstract: Wavelength-shifting interferometry can distinguish in frequency space interference signals from different surfaces, and therefore allows the measurement of optical thickness variation between several quasi-parallel surfaces of a composite transparent object. Frequency analysis of the signal spectrum with a tunable phase-shifting formula can then detect the phase of the individual signals. We have devised a tunable phase-shifting method which uses a freely adjustable number of intensity samples and can be adapted to any frequency spectrum. To extract the signal reliably, two properties of the phase-shifting method are particularly important: it should suppress cross-talk from unwanted frequencies, and it should allow for some variation in the signal frequency. We show that a carefully designed sampling function envelope will combine these benefits, and demonstrate the technique in measurements of three different composite objects each consisting of three reflecting surfaces. The importance of phase-shift linearisation is discussed, and methods for selecting optimal set-up parameters are given. [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Optics & Lasers in Engineering is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.optlaseng.2005.12.009
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      – Code: eng
        Text: English
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        PageCount: 16
        StartPage: 326
    Subjects:
      – SubjectFull: Optical measurements
        Type: general
      – SubjectFull: Spectrum analysis
        Type: general
      – SubjectFull: Interferometry
        Type: general
      – SubjectFull: Optics
        Type: general
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      – TitleFull: Simultaneous measurement of several near-parallel surfaces with wavelength-shifting interferometry and a tunable phase-shifting method
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            NameFull: Burke, Jan
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            NameFull: Hibino, Kenichi
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            NameFull: Hanayama, Ryohei
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              M: 02
              Text: Feb2007
              Type: published
              Y: 2007
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