APA (7th ed.) Citation

Gravalidis, C., Logothetidis, S., Hatziaras, N., Laskarakis, A., Tsiaoussis, I., & Frangis, N. (2006). Characterization of Si nanocrystals into SiO2 matrix. Applied Surface Science, 253(1), 385. https://doi.org/10.1016/j.apsusc.2006.06.019

Chicago Style (17th ed.) Citation

Gravalidis, C., S. Logothetidis, N. Hatziaras, A. Laskarakis, I. Tsiaoussis, and N. Frangis. "Characterization of Si Nanocrystals into SiO2 Matrix." Applied Surface Science 253, no. 1 (2006): 385. https://doi.org/10.1016/j.apsusc.2006.06.019.

MLA (9th ed.) Citation

Gravalidis, C., et al. "Characterization of Si Nanocrystals into SiO2 Matrix." Applied Surface Science, vol. 253, no. 1, 2006, p. 385, https://doi.org/10.1016/j.apsusc.2006.06.019.