APA (7th ed.) Citation

Sarab, A. A. P., Datta, D., & Dasgupta, S. (2006). Nanoscale device architecture to reduce leakage currents through quantum-mechanical simulation. Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures, 24(3), 1384. https://doi.org/10.1116/1.2201040

Chicago Style (17th ed.) Citation

Sarab, A. A. P., Deepanjan Datta, and Sudeb Dasgupta. "Nanoscale Device Architecture to Reduce Leakage Currents Through Quantum-mechanical Simulation." Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures 24, no. 3 (2006): 1384. https://doi.org/10.1116/1.2201040.

MLA (9th ed.) Citation

Sarab, A. A. P., et al. "Nanoscale Device Architecture to Reduce Leakage Currents Through Quantum-mechanical Simulation." Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures, vol. 24, no. 3, 2006, p. 1384, https://doi.org/10.1116/1.2201040.