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Synthesis of Surface Initiated Diblock Copolymer Brushes from Flat Silicon Substrates Utilizing the RAFT Polymerization Technique.

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Title: Synthesis of Surface Initiated Diblock Copolymer Brushes from Flat Silicon Substrates Utilizing the RAFT Polymerization Technique.
Authors: Misty D. Rowe-Konopacki1, Stephen G. Boyes1
Source: Macromolecules. Feb2007, Vol. 40 Issue 4, p879-888. 10p.
Subjects: Diblock copolymers, Silicon, Polymerization, X-ray photoelectron spectroscopy
Abstract: The synthesis of a variety of well-defined diblock copolymer brushes, including poly(methyl methacrylate) (PMMA)-b-poly(2-(dimethylamino)ethyl methacrylate) (PDMAEMA), PMMA-b-poly(styrene) (PSty), and PSty-b-poly(methyl acrylate), was achieved via surface immobilized reversible addition−fragmentation chain transfer (RAFT) polymerization. Initially, silicon surfaces were modified with RAFT chain transfer agents (CTAs) by utilizing a modified atom transfer addition reaction involving a silicon wafer modified with (11-(2-bromo-2-methyl)propionyloxy)undecyltrichlorosilane and dithiobenzoyl disulfide. Diblock copolymer brushes were then prepared via sequential surface initiated RAFT polymerization from the immobilized CTA. Various characterization techniques including ellipsometry, contact angle measurements, grazing angle attenuated total reflectance−Fourier transform infrared spectroscopy, and X-ray photoelectron spectroscopy were used to characterize the immobilization of CTAs on the silicon wafer and the subsequent polymer formation. The addition of free CTA was required for the formation of well-defined diblock copolymer brushes, which subsequently resulted in the presence of free polymer chains in solution. The free polymer chains were isolated and used to estimate the molecular weights and polydispersity index of chains attached to the surface. [ABSTRACT FROM AUTHOR]
Copyright of Macromolecules is the property of American Chemical Society and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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PubType: Academic Journal
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  Data: Synthesis of Surface Initiated Diblock Copolymer Brushes from Flat Silicon Substrates Utilizing the RAFT Polymerization Technique.
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  Data: <searchLink fieldCode="JN" term="%22Macromolecules%22">Macromolecules</searchLink>. Feb2007, Vol. 40 Issue 4, p879-888. 10p.
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  Data: <searchLink fieldCode="DE" term="%22Diblock+copolymers%22">Diblock copolymers</searchLink><br /><searchLink fieldCode="DE" term="%22Silicon%22">Silicon</searchLink><br /><searchLink fieldCode="DE" term="%22Polymerization%22">Polymerization</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+photoelectron+spectroscopy%22">X-ray photoelectron spectroscopy</searchLink>
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  Data: The synthesis of a variety of well-defined diblock copolymer brushes, including poly(methyl methacrylate) (PMMA)-b-poly(2-(dimethylamino)ethyl methacrylate) (PDMAEMA), PMMA-b-poly(styrene) (PSty), and PSty-b-poly(methyl acrylate), was achieved via surface immobilized reversible addition−fragmentation chain transfer (RAFT) polymerization. Initially, silicon surfaces were modified with RAFT chain transfer agents (CTAs) by utilizing a modified atom transfer addition reaction involving a silicon wafer modified with (11-(2-bromo-2-methyl)propionyloxy)undecyltrichlorosilane and dithiobenzoyl disulfide. Diblock copolymer brushes were then prepared via sequential surface initiated RAFT polymerization from the immobilized CTA. Various characterization techniques including ellipsometry, contact angle measurements, grazing angle attenuated total reflectance−Fourier transform infrared spectroscopy, and X-ray photoelectron spectroscopy were used to characterize the immobilization of CTAs on the silicon wafer and the subsequent polymer formation. The addition of free CTA was required for the formation of well-defined diblock copolymer brushes, which subsequently resulted in the presence of free polymer chains in solution. The free polymer chains were isolated and used to estimate the molecular weights and polydispersity index of chains attached to the surface. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Macromolecules is the property of American Chemical Society and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1021/ma0623340
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      – Code: eng
        Text: English
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        PageCount: 10
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      – SubjectFull: Diblock copolymers
        Type: general
      – SubjectFull: Silicon
        Type: general
      – SubjectFull: Polymerization
        Type: general
      – SubjectFull: X-ray photoelectron spectroscopy
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      – TitleFull: Synthesis of Surface Initiated Diblock Copolymer Brushes from Flat Silicon Substrates Utilizing the RAFT Polymerization Technique.
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              Text: Feb2007
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