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Study of the growth of NiO on highly oriented pyrolytic graphite by X-ray absorption spectroscopy

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Title: Study of the growth of NiO on highly oriented pyrolytic graphite by X-ray absorption spectroscopy
Authors: Preda, I.1, Abbate, M.2, Gutiérrez, A.1, Palacín, S.1, Vollmer, A.3, Soriano, L.1 l.soriano@uam.es
Source: Journal of Electron Spectroscopy & Related Phenomena. May2007, Vol. 156-158, p111-114. 4p.
Subjects: X-ray spectroscopy, Atomic force microscopy, Nanostructures, Spectrum analysis
Abstract: Abstract: In this work, we present a X-ray absorption spectroscopy (XAS) study of the growth of NiO on highly oriented pyrolytic graphite (HOPG). NiO has been grown by reactive evaporation of metallic Ni in an oxygen atmosphere (2×10−5 Torr) at room temperature. We paid special attention to the study of the early stages of growth. Both, Ni 2p and O 1s core-level XAS spectra were measured. For large NiO coverages, the spectra resemble that of a NiO single crystal, thus indicating the formation of a stoichiometric NiO thin film on the HOPG substrate. The Ni 2p XAS spectra remain similar during the whole growth process, indicating that Ni atoms are present in the high spin Ni2+ form, as supported by multiplet calculations. In contrast, for low coverages the line-shape of the O 1s XAS spectra differ strongly from that of bulk NiO. Cluster calculations of the spectra in octahedral and pyramidal symmetries support the formation of nanometric planar NiO islands at the graphite steps as previously observed by atomic force microscopy (AFM) in this system. [Copyright &y& Elsevier]
Copyright of Journal of Electron Spectroscopy & Related Phenomena is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 24873884
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Study of the growth of NiO on highly oriented pyrolytic graphite by X-ray absorption spectroscopy
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  Data: <searchLink fieldCode="AR" term="%22Preda%2C+I%2E%22">Preda, I.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Abbate%2C+M%2E%22">Abbate, M.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Gutiérrez%2C+A%2E%22">Gutiérrez, A.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Palacín%2C+S%2E%22">Palacín, S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Vollmer%2C+A%2E%22">Vollmer, A.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Soriano%2C+L%2E%22">Soriano, L.</searchLink><relatesTo>1</relatesTo><i> l.soriano@uam.es</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electron+Spectroscopy+%26+Related+Phenomena%22">Journal of Electron Spectroscopy & Related Phenomena</searchLink>. May2007, Vol. 156-158, p111-114. 4p.
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  Data: <searchLink fieldCode="DE" term="%22X-ray+spectroscopy%22">X-ray spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Nanostructures%22">Nanostructures</searchLink><br /><searchLink fieldCode="DE" term="%22Spectrum+analysis%22">Spectrum analysis</searchLink>
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  Data: Abstract: In this work, we present a X-ray absorption spectroscopy (XAS) study of the growth of NiO on highly oriented pyrolytic graphite (HOPG). NiO has been grown by reactive evaporation of metallic Ni in an oxygen atmosphere (2×10−5 Torr) at room temperature. We paid special attention to the study of the early stages of growth. Both, Ni 2p and O 1s core-level XAS spectra were measured. For large NiO coverages, the spectra resemble that of a NiO single crystal, thus indicating the formation of a stoichiometric NiO thin film on the HOPG substrate. The Ni 2p XAS spectra remain similar during the whole growth process, indicating that Ni atoms are present in the high spin Ni2+ form, as supported by multiplet calculations. In contrast, for low coverages the line-shape of the O 1s XAS spectra differ strongly from that of bulk NiO. Cluster calculations of the spectra in octahedral and pyramidal symmetries support the formation of nanometric planar NiO islands at the graphite steps as previously observed by atomic force microscopy (AFM) in this system. [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Journal of Electron Spectroscopy & Related Phenomena is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.elspec.2006.11.030
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      – Code: eng
        Text: English
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      – SubjectFull: Atomic force microscopy
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      – SubjectFull: Nanostructures
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      – SubjectFull: Spectrum analysis
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              Text: May2007
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              Y: 2007
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              Value: 156-158
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