View in EDS PDF Full Text

Analysis of the field of a plane SH-wave scattered by a finite crack on the interface of materials.

Saved in:
Bibliographic Details
Title: Analysis of the field of a plane SH-wave scattered by a finite crack on the interface of materials.
Authors: Kurylyak, D. B.1, Nazarchuk, Z. T.1, Voitko, M. V.1
Source: Materials Science. Nov2006, Vol. 42 Issue 6, p711-724. 14p. 4 Diagrams, 1 Graph.
Subjects: Elastic wave diffraction, Head waves, Wiener-Hopf equations, Surface defects, Elasticity, Materials science
Abstract: We solve the problem of diffraction of plane elastic SH-waves on a crack of finite width located in the plane interface of two different perfectly joined isotropic elastic materials. The problem is solved by the Wiener-Hopf method. An approximate solution of the Wiener-Hopf equation is obtained. The numerical results in the far-field zone are presented for a broad frequency band. The specific features of distribution of the radiation field in the zone of critical angles are analyzed. The probability of excitation of lateral waves is investigated and the possibility of detection of defects is discussed. A simple experimental procedure is proposed for the NDT evaluation of crack width in a test bench based on measuring the modulus of the field of displacements in the zone of critical angles. [ABSTRACT FROM AUTHOR]
Copyright of Materials Science is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Links:
  – Type: pdflink
Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 24941881
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Analysis of the field of a plane SH-wave scattered by a finite crack on the interface of materials.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Kurylyak%2C+D%2E+B%2E%22">Kurylyak, D. B.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Nazarchuk%2C+Z%2E+T%2E%22">Nazarchuk, Z. T.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Voitko%2C+M%2E+V%2E%22">Voitko, M. V.</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Materials+Science%22">Materials Science</searchLink>. Nov2006, Vol. 42 Issue 6, p711-724. 14p. 4 Diagrams, 1 Graph.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Elastic+wave+diffraction%22">Elastic wave diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Head+waves%22">Head waves</searchLink><br /><searchLink fieldCode="DE" term="%22Wiener-Hopf+equations%22">Wiener-Hopf equations</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+defects%22">Surface defects</searchLink><br /><searchLink fieldCode="DE" term="%22Elasticity%22">Elasticity</searchLink><br /><searchLink fieldCode="DE" term="%22Materials+science%22">Materials science</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: We solve the problem of diffraction of plane elastic SH-waves on a crack of finite width located in the plane interface of two different perfectly joined isotropic elastic materials. The problem is solved by the Wiener-Hopf method. An approximate solution of the Wiener-Hopf equation is obtained. The numerical results in the far-field zone are presented for a broad frequency band. The specific features of distribution of the radiation field in the zone of critical angles are analyzed. The probability of excitation of lateral waves is investigated and the possibility of detection of defects is discussed. A simple experimental procedure is proposed for the NDT evaluation of crack width in a test bench based on measuring the modulus of the field of displacements in the zone of critical angles. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Materials Science is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=24941881
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s11003-006-0139-9
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 14
        StartPage: 711
    Subjects:
      – SubjectFull: Elastic wave diffraction
        Type: general
      – SubjectFull: Head waves
        Type: general
      – SubjectFull: Wiener-Hopf equations
        Type: general
      – SubjectFull: Surface defects
        Type: general
      – SubjectFull: Elasticity
        Type: general
      – SubjectFull: Materials science
        Type: general
    Titles:
      – TitleFull: Analysis of the field of a plane SH-wave scattered by a finite crack on the interface of materials.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Kurylyak, D. B.
      – PersonEntity:
          Name:
            NameFull: Nazarchuk, Z. T.
      – PersonEntity:
          Name:
            NameFull: Voitko, M. V.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 11
              Text: Nov2006
              Type: published
              Y: 2006
          Identifiers:
            – Type: issn-print
              Value: 1068820X
          Numbering:
            – Type: volume
              Value: 42
            – Type: issue
              Value: 6
          Titles:
            – TitleFull: Materials Science
              Type: main
ResultId 1