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Measurement of oxygen reduction activities via the rotating disc electrode method: From Pt model surfaces to carbon-supported high surface area catalysts

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Title: Measurement of oxygen reduction activities via the rotating disc electrode method: From Pt model surfaces to carbon-supported high surface area catalysts
Authors: Mayrhofer, K.J.J.1 karl.mayrhofer@mytum.de, Strmcnik, D.2, Blizanac, B.B.2, Stamenkovic, V.2, Arenz, M.1, Markovic, N.M.2
Source: Electrochimica Acta. Feb2008, Vol. 53 Issue 7, p3181-3188. 8p.
Subjects: Electrodes, Electrocatalysis, Polycrystalline semiconductors, Adsorption (Chemistry)
Abstract: Abstract: The aim of this report is to scrutinize the thin-film rotating disc electrode (TF-RDE) method for investigating the electrocatalytic activity of high surface area catalysts. Special emphasis is given to the oxygen reduction reaction (ORR) on carbon-supported platinum catalysts. On the basis of measurements on four different Pt catalyst samples with various average particle sizes, it is demonstrated in detail how the intrinsic properties of the catalyst, i.e., the mass activity (A/gPt) and the specific activity (A/m2 Pt), are evaluated. The potential sources of error are critically discussed and guidelines for the measurements are given. Furthermore, the specific ORR activities determined for the different catalyst samples are analyzed and compared to polycrystalline Pt. The previously reported effect of the particle size on the specific activity for the ORR is interpreted on the basis of the shift in the potential of zero total charge and the concomitant alteration of the adsorption properties. [Copyright &y& Elsevier]
Copyright of Electrochimica Acta is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Measurement of oxygen reduction activities via the rotating disc electrode method: From Pt model surfaces to carbon-supported high surface area catalysts
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  Data: <searchLink fieldCode="JN" term="%22Electrochimica+Acta%22">Electrochimica Acta</searchLink>. Feb2008, Vol. 53 Issue 7, p3181-3188. 8p.
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  Data: <searchLink fieldCode="DE" term="%22Electrodes%22">Electrodes</searchLink><br /><searchLink fieldCode="DE" term="%22Electrocatalysis%22">Electrocatalysis</searchLink><br /><searchLink fieldCode="DE" term="%22Polycrystalline+semiconductors%22">Polycrystalline semiconductors</searchLink><br /><searchLink fieldCode="DE" term="%22Adsorption+%28Chemistry%29%22">Adsorption (Chemistry)</searchLink>
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  Data: Abstract: The aim of this report is to scrutinize the thin-film rotating disc electrode (TF-RDE) method for investigating the electrocatalytic activity of high surface area catalysts. Special emphasis is given to the oxygen reduction reaction (ORR) on carbon-supported platinum catalysts. On the basis of measurements on four different Pt catalyst samples with various average particle sizes, it is demonstrated in detail how the intrinsic properties of the catalyst, i.e., the mass activity (A/gPt) and the specific activity (A/m2 Pt), are evaluated. The potential sources of error are critically discussed and guidelines for the measurements are given. Furthermore, the specific ORR activities determined for the different catalyst samples are analyzed and compared to polycrystalline Pt. The previously reported effect of the particle size on the specific activity for the ORR is interpreted on the basis of the shift in the potential of zero total charge and the concomitant alteration of the adsorption properties. [Copyright &y& Elsevier]
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  Data: <i>Copyright of Electrochimica Acta is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.electacta.2007.11.057
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        Text: English
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      – SubjectFull: Polycrystalline semiconductors
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