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Time-resolved photoluminescence characterizes semiconductors.

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Bibliographic Details
Title: Time-resolved photoluminescence characterizes semiconductors.
Authors: Wahl, Michael
Source: Laser Focus World. Jul2000, Vol. 36 Issue 7, pS15. 4p. 1 Diagram, 2 Graphs.
Subjects: Semiconductor characterization, Photoluminescence
Abstract: Stresses the advantages of the time-resolved photoluminescence (TPRL) method for measuring the material characteristics of semiconductor devices. Applications of time-resolved photoluminescence (TRPL); Practical hindrances to the solution; Examples of TRPL measurement.
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 3311053
AccessLevel: 6
PubType: Periodical
PubTypeId: serialPeriodical
PreciseRelevancyScore: 0
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  Data: Time-resolved photoluminescence characterizes semiconductors.
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  Data: <searchLink fieldCode="AR" term="%22Wahl%2C+Michael%22">Wahl, Michael</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Laser+Focus+World%22">Laser Focus World</searchLink>. Jul2000, Vol. 36 Issue 7, pS15. 4p. 1 Diagram, 2 Graphs.
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  Data: Stresses the advantages of the time-resolved photoluminescence (TPRL) method for measuring the material characteristics of semiconductor devices. Applications of time-resolved photoluminescence (TRPL); Practical hindrances to the solution; Examples of TRPL measurement.
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RecordInfo BibRecord:
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      – Code: eng
        Text: English
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        PageCount: 4
        StartPage: S15
    Subjects:
      – SubjectFull: Semiconductor characterization
        Type: general
      – SubjectFull: Photoluminescence
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              Text: Jul2000
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              Y: 2000
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