An EFSM-based Test Generation for Validation of SDL Specifications.
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| Title: | An EFSM-based Test Generation for Validation of SDL Specifications. |
|---|---|
| Authors: | Wong, W. Eric1 ewong@utdallas.edu, Restrepo, Andy1, Yu Qi1, Byoungju Choi2 |
| Source: | ICSE: International Conference on Software Engineering. 2008, p25-32. 8p. 4 Color Photographs, 5 Diagrams, 1 Chart, 2 Graphs. |
| Subjects: | SDL (Computer program language), Programming languages, Computer programming, Computer software development, Software engineering |
| Abstract: | Existing techniques for testing an SDL specification mainly allow for either black box simulation or conformance testing to verify that the behavior of an implementation matches its corresponding model. However, this relies on the potentially hazardous assumption that the model is completely correct. We propose a test generation framework that can accomplish conformance verification as well as coverage criteria-driven white box testing of the specification itself This approach builds on earlier work which established how to translate SDL processes into standard EFSMs and identify "hot spots" - nodes or edges in the EFSM which should be prioritized during testing to effectively increase coverage. Our technique generates test sequences intended to cover selected hot spots; we address the possible infeasibility of such a test sequence by allowing for its rejection decided by a constraint solver and re-generation of an alternate test sequence to the hot spot. In this paper, we present our EFSM translation and test generation tool and provide a case study demonstrating the effectiveness of our coverage-based test sequence selection. [ABSTRACT FROM AUTHOR] |
| Copyright of ICSE: International Conference on Software Engineering is the property of Association for Computing Machinery and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Items | – Name: Title Label: Title Group: Ti Data: An EFSM-based Test Generation for Validation of SDL Specifications. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Wong%2C+W%2E+Eric%22">Wong, W. Eric</searchLink><relatesTo>1</relatesTo><i> ewong@utdallas.edu</i><br /><searchLink fieldCode="AR" term="%22Restrepo%2C+Andy%22">Restrepo, Andy</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Yu+Qi%22">Yu Qi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Byoungju+Choi%22">Byoungju Choi</searchLink><relatesTo>2</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22ICSE%3A+International+Conference+on+Software+Engineering%22">ICSE: International Conference on Software Engineering</searchLink>. 2008, p25-32. 8p. 4 Color Photographs, 5 Diagrams, 1 Chart, 2 Graphs. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22SDL+%28Computer+program+language%29%22">SDL (Computer program language)</searchLink><br /><searchLink fieldCode="DE" term="%22Programming+languages%22">Programming languages</searchLink><br /><searchLink fieldCode="DE" term="%22Computer+programming%22">Computer programming</searchLink><br /><searchLink fieldCode="DE" term="%22Computer+software+development%22">Computer software development</searchLink><br /><searchLink fieldCode="DE" term="%22Software+engineering%22">Software engineering</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Existing techniques for testing an SDL specification mainly allow for either black box simulation or conformance testing to verify that the behavior of an implementation matches its corresponding model. However, this relies on the potentially hazardous assumption that the model is completely correct. We propose a test generation framework that can accomplish conformance verification as well as coverage criteria-driven white box testing of the specification itself This approach builds on earlier work which established how to translate SDL processes into standard EFSMs and identify "hot spots" - nodes or edges in the EFSM which should be prioritized during testing to effectively increase coverage. Our technique generates test sequences intended to cover selected hot spots; we address the possible infeasibility of such a test sequence by allowing for its rejection decided by a constraint solver and re-generation of an alternate test sequence to the hot spot. In this paper, we present our EFSM translation and test generation tool and provide a case study demonstrating the effectiveness of our coverage-based test sequence selection. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of ICSE: International Conference on Software Engineering is the property of Association for Computing Machinery and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 25 Subjects: – SubjectFull: SDL (Computer program language) Type: general – SubjectFull: Programming languages Type: general – SubjectFull: Computer programming Type: general – SubjectFull: Computer software development Type: general – SubjectFull: Software engineering Type: general Titles: – TitleFull: An EFSM-based Test Generation for Validation of SDL Specifications. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Wong, W. Eric – PersonEntity: Name: NameFull: Restrepo, Andy – PersonEntity: Name: NameFull: Yu Qi – PersonEntity: Name: NameFull: Byoungju Choi IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 02 Text: 2008 Type: published Y: 2008 Titles: – TitleFull: ICSE: International Conference on Software Engineering Type: main |
| ResultId | 1 |
