Off-line inspections under inspection errors.
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| Title: | Off-line inspections under inspection errors. |
|---|---|
| Authors: | Tzimerman, Avinoam1 (AUTHOR), Herer, YaleT.1 (AUTHOR) yale@technion.ac.il |
| Source: | IIE Transactions. Jul2009, Vol. 41 Issue 7, p626-641. 16p. |
| Subjects: | Engineering inspection, Optical quality control, Dynamic programming, Systems engineering, Quality control, Operations research, Mathematical optimization |
| Abstract: | The problem of off-line inspection is of both practical and theoretical interest. It has been the subject of research in somewhat simplistic scenarios. In this paper, the theoretical coverage of this problem is extended to include inspection errors. In particular, a process which is subject to random failures that sequentially produces a batch of units is investigated. After the batch is complete, off-line inspections are performed. In the proposed model it is these inspections that are subject to errors. The optimal inspection policy, i.e., which units should be inspected and the inspection order so as to minimize the expected number of inspections, is determined. The considered objective function is to find the point at which the machine fails with a given confidence level. The optimal policy is found by a dynamic programming algorithm and four different heuristic policies are investigated. An extensive computational study that examines the behavior of both the optimal and heuristic policies is presented. In particular, the effect of the model parameters on the behavior of the optimal policy is analyzed. The heuristic policies are computationally studied with the goal of comparing their quality to the optimal solution, and also to compare the heuristics themselves. [ABSTRACT FROM AUTHOR] |
| Copyright of IIE Transactions is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 37819243 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Off-line inspections under inspection errors. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Tzimerman%2C+Avinoam%22">Tzimerman, Avinoam</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Herer%2C+YaleT%2E%22">Herer, YaleT.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> yale@technion.ac.il</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22IIE+Transactions%22">IIE Transactions</searchLink>. Jul2009, Vol. 41 Issue 7, p626-641. 16p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Engineering+inspection%22">Engineering inspection</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+quality+control%22">Optical quality control</searchLink><br /><searchLink fieldCode="DE" term="%22Dynamic+programming%22">Dynamic programming</searchLink><br /><searchLink fieldCode="DE" term="%22Systems+engineering%22">Systems engineering</searchLink><br /><searchLink fieldCode="DE" term="%22Quality+control%22">Quality control</searchLink><br /><searchLink fieldCode="DE" term="%22Operations+research%22">Operations research</searchLink><br /><searchLink fieldCode="DE" term="%22Mathematical+optimization%22">Mathematical optimization</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The problem of off-line inspection is of both practical and theoretical interest. It has been the subject of research in somewhat simplistic scenarios. In this paper, the theoretical coverage of this problem is extended to include inspection errors. In particular, a process which is subject to random failures that sequentially produces a batch of units is investigated. After the batch is complete, off-line inspections are performed. In the proposed model it is these inspections that are subject to errors. The optimal inspection policy, i.e., which units should be inspected and the inspection order so as to minimize the expected number of inspections, is determined. The considered objective function is to find the point at which the machine fails with a given confidence level. The optimal policy is found by a dynamic programming algorithm and four different heuristic policies are investigated. An extensive computational study that examines the behavior of both the optimal and heuristic policies is presented. In particular, the effect of the model parameters on the behavior of the optimal policy is analyzed. The heuristic policies are computationally studied with the goal of comparing their quality to the optimal solution, and also to compare the heuristics themselves. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of IIE Transactions is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=37819243 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1080/07408170802331250 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 16 StartPage: 626 Subjects: – SubjectFull: Engineering inspection Type: general – SubjectFull: Optical quality control Type: general – SubjectFull: Dynamic programming Type: general – SubjectFull: Systems engineering Type: general – SubjectFull: Quality control Type: general – SubjectFull: Operations research Type: general – SubjectFull: Mathematical optimization Type: general Titles: – TitleFull: Off-line inspections under inspection errors. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Tzimerman, Avinoam – PersonEntity: Name: NameFull: Herer, YaleT. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: Jul2009 Type: published Y: 2009 Identifiers: – Type: issn-print Value: 0740817X Numbering: – Type: volume Value: 41 – Type: issue Value: 7 Titles: – TitleFull: IIE Transactions Type: main |
| ResultId | 1 |