APA (7th ed.) Citation

van Kouwen, L., Botman, A., & Hagen, C. W. (2009). Focused Electron-Beam-Induced Deposition of 3 nm Dots in a Scanning Electron Microscope. Nano Letters, 9(5), 2149. https://doi.org/10.1021/nl900717r

Chicago Style (17th ed.) Citation

van Kouwen, Leon, Aurelien Botman, and Cornelis W. Hagen. "Focused Electron-Beam-Induced Deposition of 3 Nm Dots in a Scanning Electron Microscope." Nano Letters 9, no. 5 (2009): 2149. https://doi.org/10.1021/nl900717r.

MLA (9th ed.) Citation

van Kouwen, Leon, et al. "Focused Electron-Beam-Induced Deposition of 3 Nm Dots in a Scanning Electron Microscope." Nano Letters, vol. 9, no. 5, 2009, p. 2149, https://doi.org/10.1021/nl900717r.