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Pass-Fail Testing: Statistical Requirements and Interpretations.

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Title: Pass-Fail Testing: Statistical Requirements and Interpretations.
Authors: Gilliam, David1 david.gilliam@nist.gov, Leigh, Stefan1 stefan.leigh@nist.gov, Rukhin, Andrew1 andrew.rukhin@nist.gov, Strawderman, William1 william.strawderman@nist.gov
Source: Journal of Research of the National Institute of Standards & Technology. May2009, Vol. 114 Issue 3, p195-199. 5p. 1 Chart, 1 Graph.
Subjects: Pass-fail grading system, Binomial distribution, False alarms, Grading of students, Statistics
Abstract: Performance standards for detector systems often include requirements for probability of detection and probability of false alarm at a specified level of statistical confidence. This paper reviews the accepted definitions of confidence level and of critical value. It describes the testing requirements for establishing either of these probabilities at a desired confidence level. These requirements are computable in terms of functions that are readily avail-able in statistical software packages and general spreadsheet applications. The statistical interpretations of the critical values are discussed. A table is included for illustration, and a plot is presented showing the minimum required numbers of pass-fail tests. The results given here are applicable to one-sided testing of any system with performance characteristics conforming to a binomial distribution. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Research of the National Institute of Standards & Technology is the property of US Department of Commerce and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Pass-Fail Testing: Statistical Requirements and Interpretations.
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  Data: <searchLink fieldCode="AR" term="%22Gilliam%2C+David%22">Gilliam, David</searchLink><relatesTo>1</relatesTo><i> david.gilliam@nist.gov</i><br /><searchLink fieldCode="AR" term="%22Leigh%2C+Stefan%22">Leigh, Stefan</searchLink><relatesTo>1</relatesTo><i> stefan.leigh@nist.gov</i><br /><searchLink fieldCode="AR" term="%22Rukhin%2C+Andrew%22">Rukhin, Andrew</searchLink><relatesTo>1</relatesTo><i> andrew.rukhin@nist.gov</i><br /><searchLink fieldCode="AR" term="%22Strawderman%2C+William%22">Strawderman, William</searchLink><relatesTo>1</relatesTo><i> william.strawderman@nist.gov</i>
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  Data: <searchLink fieldCode="DE" term="%22Pass-fail+grading+system%22">Pass-fail grading system</searchLink><br /><searchLink fieldCode="DE" term="%22Binomial+distribution%22">Binomial distribution</searchLink><br /><searchLink fieldCode="DE" term="%22False+alarms%22">False alarms</searchLink><br /><searchLink fieldCode="DE" term="%22Grading+of+students%22">Grading of students</searchLink><br /><searchLink fieldCode="DE" term="%22Statistics%22">Statistics</searchLink>
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  Data: Performance standards for detector systems often include requirements for probability of detection and probability of false alarm at a specified level of statistical confidence. This paper reviews the accepted definitions of confidence level and of critical value. It describes the testing requirements for establishing either of these probabilities at a desired confidence level. These requirements are computable in terms of functions that are readily avail-able in statistical software packages and general spreadsheet applications. The statistical interpretations of the critical values are discussed. A table is included for illustration, and a plot is presented showing the minimum required numbers of pass-fail tests. The results given here are applicable to one-sided testing of any system with performance characteristics conforming to a binomial distribution. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Journal of Research of the National Institute of Standards & Technology is the property of US Department of Commerce and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.6028/jres.114.013
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      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 195
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      – SubjectFull: Pass-fail grading system
        Type: general
      – SubjectFull: Binomial distribution
        Type: general
      – SubjectFull: False alarms
        Type: general
      – SubjectFull: Grading of students
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      – SubjectFull: Statistics
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      – TitleFull: Pass-Fail Testing: Statistical Requirements and Interpretations.
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              Text: May2009
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              Y: 2009
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