Yan, J., Chen, F., & Kai, J. (2002). Mapping of sp2/sp3 in DLC thin film by signal processed ESI series energy‐loss image. Journal of Electron Microscopy, 51(6), 391. https://doi.org/10.1093/jmicro/51.6.391
Chicago Style (17th ed.) CitationYan, Jing‐Yi, Fu‐Rong Chen, and Ji‐Jung Kai. "Mapping of Sp2/sp3 in DLC Thin Film by Signal Processed ESI Series Energy‐loss Image." Journal of Electron Microscopy 51, no. 6 (2002): 391. https://doi.org/10.1093/jmicro/51.6.391.
MLA (9th ed.) CitationYan, Jing‐Yi, et al. "Mapping of Sp2/sp3 in DLC Thin Film by Signal Processed ESI Series Energy‐loss Image." Journal of Electron Microscopy, vol. 51, no. 6, 2002, p. 391, https://doi.org/10.1093/jmicro/51.6.391.
Warning: These citations may not always be 100% accurate.