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Spatio-temporal imaging of voltage pulses with a laser-gated photoconductive sampling probe.

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Title: Spatio-temporal imaging of voltage pulses with a laser-gated photoconductive sampling probe.
Authors: Steffens, W.M., Heisig, S., Keil, U.D., Oesterschulze, E.
Source: Applied Physics B: Lasers & Optics. 1999, Vol. 69 Issue 5/6, p455. 4p.
Subjects: Scanning probe microscopy, Electric transients, Microwave spectroscopy, Photoconductivity
Abstract: Abstract. We report on the fabrication process of a scanning force microscopy (SFM) cantilever probe suitable for the investigation of ultrafast transient signals in microwave integrated circuits. High temporal resolution is achieved by integrating a laser-gated photoconductive switch within a coplanar waveguide structure onto a low-temperature GaAs cantilever. This is demonstrated by temporal and spatio-temporal measurements performed on a coplanar strip line. [ABSTRACT FROM AUTHOR]
Copyright of Applied Physics B: Lasers & Optics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Spatio-temporal imaging of voltage pulses with a laser-gated photoconductive sampling probe.
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  Data: <searchLink fieldCode="AR" term="%22Steffens%2C+W%2EM%2E%22">Steffens, W.M.</searchLink><br /><searchLink fieldCode="AR" term="%22Heisig%2C+S%2E%22">Heisig, S.</searchLink><br /><searchLink fieldCode="AR" term="%22Keil%2C+U%2ED%2E%22">Keil, U.D.</searchLink><br /><searchLink fieldCode="AR" term="%22Oesterschulze%2C+E%2E%22">Oesterschulze, E.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+B%3A+Lasers+%26+Optics%22">Applied Physics B: Lasers & Optics</searchLink>. 1999, Vol. 69 Issue 5/6, p455. 4p.
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  Data: <searchLink fieldCode="DE" term="%22Scanning+probe+microscopy%22">Scanning probe microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Electric+transients%22">Electric transients</searchLink><br /><searchLink fieldCode="DE" term="%22Microwave+spectroscopy%22">Microwave spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Photoconductivity%22">Photoconductivity</searchLink>
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  Data: Abstract. We report on the fabrication process of a scanning force microscopy (SFM) cantilever probe suitable for the investigation of ultrafast transient signals in microwave integrated circuits. High temporal resolution is achieved by integrating a laser-gated photoconductive switch within a coplanar waveguide structure onto a low-temperature GaAs cantilever. This is demonstrated by temporal and spatio-temporal measurements performed on a coplanar strip line. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Applied Physics B: Lasers & Optics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – SubjectFull: Electric transients
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      – SubjectFull: Microwave spectroscopy
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      – SubjectFull: Photoconductivity
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      – TitleFull: Spatio-temporal imaging of voltage pulses with a laser-gated photoconductive sampling probe.
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              Text: 1999
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