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Resonance modes of voltage-modulated scanning force microscopy.

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Title: Resonance modes of voltage-modulated scanning force microscopy.
Authors: Labardi, M., Likodimos, V., Allegrini, M.
Source: Applied Physics A: Materials Science & Processing. 2001, Vol. 72 Issue 7, pS79. 7p.
Subjects: Resonance, Scanning force microscopy, Vibration (Mechanics), Triglycine sulfate
Abstract: Abstract. Mechanical resonance modes of the scanning force microscope (SFM) cantilever in contact conditions provide contrast enhancement in the imaging of surface charges when using voltage modulation techniques tuned to such resonances. Extensions of the method were made as regards the lateral (twisting) and frontal (buckling) modes of the cantilever, as well as the enhanced second harmonic detection of voltage-modulated response at resonance and near-resonance detection in the SFM tapping mode. As an example of application, vibration spectra and images taken on a triglycine sulfate (TGS) single crystal are discussed. [ABSTRACT FROM AUTHOR]
Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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An: 4725471
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PubType: Academic Journal
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  Data: Resonance modes of voltage-modulated scanning force microscopy.
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  Label: Abstract
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  Data: Abstract. Mechanical resonance modes of the scanning force microscope (SFM) cantilever in contact conditions provide contrast enhancement in the imaging of surface charges when using voltage modulation techniques tuned to such resonances. Extensions of the method were made as regards the lateral (twisting) and frontal (buckling) modes of the cantilever, as well as the enhanced second harmonic detection of voltage-modulated response at resonance and near-resonance detection in the SFM tapping mode. As an example of application, vibration spectra and images taken on a triglycine sulfate (TGS) single crystal are discussed. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s003390100631
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      – SubjectFull: Vibration (Mechanics)
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