APA (7th ed.) Citation

Heisig, S., & Oesterschulze, E. (1998). Gallium arsenide probes for scanning near-field probe microscopy. Applied Physics A: Materials Science & Processing, 66(7), S385. https://doi.org/10.1007/s003390051169

Chicago Style (17th ed.) Citation

Heisig, S., and E. Oesterschulze. "Gallium Arsenide Probes for Scanning Near-field Probe Microscopy." Applied Physics A: Materials Science & Processing 66, no. 7 (1998): S385. https://doi.org/10.1007/s003390051169.

MLA (9th ed.) Citation

Heisig, S., and E. Oesterschulze. "Gallium Arsenide Probes for Scanning Near-field Probe Microscopy." Applied Physics A: Materials Science & Processing, vol. 66, no. 7, 1998, p. S385, https://doi.org/10.1007/s003390051169.