Lin, Y., & Lee, C. (2001). A total standard WIP estimation method for wafer fabrication. European Journal of Operational Research, 131(1), 78. https://doi.org/10.1016/S0377-2217(99)00446-4
Chicago Style (17th ed.) CitationLin, Yu-Hsin, and Ching-En Lee. "A Total Standard WIP Estimation Method for Wafer Fabrication." European Journal of Operational Research 131, no. 1 (2001): 78. https://doi.org/10.1016/S0377-2217(99)00446-4.
MLA (9th ed.) CitationLin, Yu-Hsin, and Ching-En Lee. "A Total Standard WIP Estimation Method for Wafer Fabrication." European Journal of Operational Research, vol. 131, no. 1, 2001, p. 78, https://doi.org/10.1016/S0377-2217(99)00446-4.
Warning: These citations may not always be 100% accurate.