Estimation of the characteristic parameters of the multilayered film model using the patterson differential function.
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| Title: | Estimation of the characteristic parameters of the multilayered film model using the patterson differential function. |
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| Authors: | Astaf'ev, S. B.1 webmaster@ns.crys.ras.ru, Shchedrin, B. M.1,2, Yanusova, L. G.1 |
| Source: | Crystallography Reports. Jan2010, Vol. 55 Issue 1, p127-135. 9p. 2 Charts, 6 Graphs. |
| Subjects: | Patterson function, Autocorrelation (Statistics), Crystallography, Electron distribution, Physical sciences |
| Abstract: | The possibility of estimating the layered film structural parameters by constructing the autocorrelation function P F( z) (referred to as the Patterson differential function) for the derivative dρ/ dz of electron density along the normal to the sample surface has been considered. An analytical expression P F( z) is presented for a multilayered film within the box model of the electron density profile. The possibilities of selecting structural information about layered films by analyzing the features of this function are demonstrated by model and real examples, in particular, by applying the method of shifted systems of peaks for the function P F( z). [ABSTRACT FROM AUTHOR] |
| Copyright of Crystallography Reports is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 47817160 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Estimation of the characteristic parameters of the multilayered film model using the patterson differential function. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Astaf'ev%2C+S%2E+B%2E%22">Astaf'ev, S. B.</searchLink><relatesTo>1</relatesTo><i> webmaster@ns.crys.ras.ru</i><br /><searchLink fieldCode="AR" term="%22Shchedrin%2C+B%2E+M%2E%22">Shchedrin, B. M.</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AR" term="%22Yanusova%2C+L%2E+G%2E%22">Yanusova, L. G.</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Crystallography+Reports%22">Crystallography Reports</searchLink>. Jan2010, Vol. 55 Issue 1, p127-135. 9p. 2 Charts, 6 Graphs. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Patterson+function%22">Patterson function</searchLink><br /><searchLink fieldCode="DE" term="%22Autocorrelation+%28Statistics%29%22">Autocorrelation (Statistics)</searchLink><br /><searchLink fieldCode="DE" term="%22Crystallography%22">Crystallography</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+distribution%22">Electron distribution</searchLink><br /><searchLink fieldCode="DE" term="%22Physical+sciences%22">Physical sciences</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The possibility of estimating the layered film structural parameters by constructing the autocorrelation function P F( z) (referred to as the Patterson differential function) for the derivative dρ/ dz of electron density along the normal to the sample surface has been considered. An analytical expression P F( z) is presented for a multilayered film within the box model of the electron density profile. The possibilities of selecting structural information about layered films by analyzing the features of this function are demonstrated by model and real examples, in particular, by applying the method of shifted systems of peaks for the function P F( z). [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Crystallography Reports is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1134/S1063774510010190 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 9 StartPage: 127 Subjects: – SubjectFull: Patterson function Type: general – SubjectFull: Autocorrelation (Statistics) Type: general – SubjectFull: Crystallography Type: general – SubjectFull: Electron distribution Type: general – SubjectFull: Physical sciences Type: general Titles: – TitleFull: Estimation of the characteristic parameters of the multilayered film model using the patterson differential function. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Astaf'ev, S. B. – PersonEntity: Name: NameFull: Shchedrin, B. M. – PersonEntity: Name: NameFull: Yanusova, L. G. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: Jan2010 Type: published Y: 2010 Identifiers: – Type: issn-print Value: 10637745 Numbering: – Type: volume Value: 55 – Type: issue Value: 1 Titles: – TitleFull: Crystallography Reports Type: main |
| ResultId | 1 |
