APA (7th ed.) Citation

Ishiwata, H., Nagai, H., Naka, T., & Itoh, M. (2010). Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope. Optical Review, 17(3), 214. https://doi.org/10.1007/s10043-010-0038-z

Chicago Style (17th ed.) Citation

Ishiwata, Hiroshi, Hiroki Nagai, Toshihisa Naka, and Masahide Itoh. "Widening the Range of High-precision Quantitative Measurement in Retardation-modulated Differential Interference Microscope." Optical Review 17, no. 3 (2010): 214. https://doi.org/10.1007/s10043-010-0038-z.

MLA (9th ed.) Citation

Ishiwata, Hiroshi, et al. "Widening the Range of High-precision Quantitative Measurement in Retardation-modulated Differential Interference Microscope." Optical Review, vol. 17, no. 3, 2010, p. 214, https://doi.org/10.1007/s10043-010-0038-z.