Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope.
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| Title: | Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope. |
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| Authors: | Ishiwata, Hiroshi1 hishiwata@ot.olympus.co.jp, Nagai, Hiroki1, Naka, Toshihisa1, Itoh, Masahide1 |
| Source: | Optical Review. May2010, Vol. 17 Issue 3, p214-217. 4p. |
| Subjects: | Measuring microscopes, Technological innovations, Contrast sensitivity (Vision), Measurement of distances, Optical instruments, Measuring instruments |
| Abstract: | The article focuses on a study related to a new technique of retardation-modulated Differential Interference Contrast (DIC) microscope that can be used in quantitative measurement. It is stated that the method uses the edges of specimen and the DIC microscope can measure the distance between images. It is inferred that the phase distribution was combined whilst moving specimen and while maintaining the characteristics of RM-DIC, measurement fields were enlarged. |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 51221969 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Ishiwata%2C+Hiroshi%22">Ishiwata, Hiroshi</searchLink><relatesTo>1</relatesTo><i> hishiwata@ot.olympus.co.jp</i><br /><searchLink fieldCode="AR" term="%22Nagai%2C+Hiroki%22">Nagai, Hiroki</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Naka%2C+Toshihisa%22">Naka, Toshihisa</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Itoh%2C+Masahide%22">Itoh, Masahide</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Optical+Review%22">Optical Review</searchLink>. May2010, Vol. 17 Issue 3, p214-217. 4p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Measuring+microscopes%22">Measuring microscopes</searchLink><br /><searchLink fieldCode="DE" term="%22Technological+innovations%22">Technological innovations</searchLink><br /><searchLink fieldCode="DE" term="%22Contrast+sensitivity+%28Vision%29%22">Contrast sensitivity (Vision)</searchLink><br /><searchLink fieldCode="DE" term="%22Measurement+of+distances%22">Measurement of distances</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+instruments%22">Optical instruments</searchLink><br /><searchLink fieldCode="DE" term="%22Measuring+instruments%22">Measuring instruments</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The article focuses on a study related to a new technique of retardation-modulated Differential Interference Contrast (DIC) microscope that can be used in quantitative measurement. It is stated that the method uses the edges of specimen and the DIC microscope can measure the distance between images. It is inferred that the phase distribution was combined whilst moving specimen and while maintaining the characteristics of RM-DIC, measurement fields were enlarged. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=51221969 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s10043-010-0038-z Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 4 StartPage: 214 Subjects: – SubjectFull: Measuring microscopes Type: general – SubjectFull: Technological innovations Type: general – SubjectFull: Contrast sensitivity (Vision) Type: general – SubjectFull: Measurement of distances Type: general – SubjectFull: Optical instruments Type: general – SubjectFull: Measuring instruments Type: general Titles: – TitleFull: Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Ishiwata, Hiroshi – PersonEntity: Name: NameFull: Nagai, Hiroki – PersonEntity: Name: NameFull: Naka, Toshihisa – PersonEntity: Name: NameFull: Itoh, Masahide IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2010 Type: published Y: 2010 Identifiers: – Type: issn-print Value: 13406000 Numbering: – Type: volume Value: 17 – Type: issue Value: 3 Titles: – TitleFull: Optical Review Type: main |
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