Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope.

Saved in:
Bibliographic Details
Title: Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope.
Authors: Ishiwata, Hiroshi1 h•ishiwata@ot.olympus.co.jp, Nagai, Hiroki1, Naka, Toshihisa1, Itoh, Masahide1
Source: Optical Review. May2010, Vol. 17 Issue 3, p214-217. 4p.
Subjects: Measuring microscopes, Technological innovations, Contrast sensitivity (Vision), Measurement of distances, Optical instruments, Measuring instruments
Abstract: The article focuses on a study related to a new technique of retardation-modulated Differential Interference Contrast (DIC) microscope that can be used in quantitative measurement. It is stated that the method uses the edges of specimen and the DIC microscope can measure the distance between images. It is inferred that the phase distribution was combined whilst moving specimen and while maintaining the characteristics of RM-DIC, measurement fields were enlarged.
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 51221969
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Ishiwata%2C+Hiroshi%22">Ishiwata, Hiroshi</searchLink><relatesTo>1</relatesTo><i> h•ishiwata@ot.olympus.co.jp</i><br /><searchLink fieldCode="AR" term="%22Nagai%2C+Hiroki%22">Nagai, Hiroki</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Naka%2C+Toshihisa%22">Naka, Toshihisa</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Itoh%2C+Masahide%22">Itoh, Masahide</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Optical+Review%22">Optical Review</searchLink>. May2010, Vol. 17 Issue 3, p214-217. 4p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Measuring+microscopes%22">Measuring microscopes</searchLink><br /><searchLink fieldCode="DE" term="%22Technological+innovations%22">Technological innovations</searchLink><br /><searchLink fieldCode="DE" term="%22Contrast+sensitivity+%28Vision%29%22">Contrast sensitivity (Vision)</searchLink><br /><searchLink fieldCode="DE" term="%22Measurement+of+distances%22">Measurement of distances</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+instruments%22">Optical instruments</searchLink><br /><searchLink fieldCode="DE" term="%22Measuring+instruments%22">Measuring instruments</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: The article focuses on a study related to a new technique of retardation-modulated Differential Interference Contrast (DIC) microscope that can be used in quantitative measurement. It is stated that the method uses the edges of specimen and the DIC microscope can measure the distance between images. It is inferred that the phase distribution was combined whilst moving specimen and while maintaining the characteristics of RM-DIC, measurement fields were enlarged.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=51221969
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s10043-010-0038-z
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 4
        StartPage: 214
    Subjects:
      – SubjectFull: Measuring microscopes
        Type: general
      – SubjectFull: Technological innovations
        Type: general
      – SubjectFull: Contrast sensitivity (Vision)
        Type: general
      – SubjectFull: Measurement of distances
        Type: general
      – SubjectFull: Optical instruments
        Type: general
      – SubjectFull: Measuring instruments
        Type: general
    Titles:
      – TitleFull: Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Ishiwata, Hiroshi
      – PersonEntity:
          Name:
            NameFull: Nagai, Hiroki
      – PersonEntity:
          Name:
            NameFull: Naka, Toshihisa
      – PersonEntity:
          Name:
            NameFull: Itoh, Masahide
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 05
              Text: May2010
              Type: published
              Y: 2010
          Identifiers:
            – Type: issn-print
              Value: 13406000
          Numbering:
            – Type: volume
              Value: 17
            – Type: issue
              Value: 3
          Titles:
            – TitleFull: Optical Review
              Type: main
ResultId 1