Precise monitoring of the surface topology of ST 50-1 glass ceramic substrates.

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Title: Precise monitoring of the surface topology of ST 50-1 glass ceramic substrates.
Authors: Besogonov, V.1 besog@udman.ru, Skvortsova, I.2 lazer@istu.ru
Source: Measurement Techniques. Mar2010, Vol. 53 Issue 3, p347-349. 3p. 2 Graphs.
Subjects: Surfaces (Technology), Atomic force microscopy, Nanostructured materials, Laser beams, Radiation
Abstract: The possibility of obtaining smooth surfaces for glass ceramic substrates under the action of laser radiation is studied. A procedure is considered for local monitoring of ST 50-1 glass ceramic surface topology by means of a scanning probe microscope in contact and semicontact regimes before and after the action of laser radiation. [ABSTRACT FROM AUTHOR]
Copyright of Measurement Techniques is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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DbLabel: Engineering Source
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  Data: The possibility of obtaining smooth surfaces for glass ceramic substrates under the action of laser radiation is studied. A procedure is considered for local monitoring of ST 50-1 glass ceramic surface topology by means of a scanning probe microscope in contact and semicontact regimes before and after the action of laser radiation. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Measurement Techniques is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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