Precise monitoring of the surface topology of ST 50-1 glass ceramic substrates.
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| Title: | Precise monitoring of the surface topology of ST 50-1 glass ceramic substrates. |
|---|---|
| Authors: | Besogonov, V.1 besog@udman.ru, Skvortsova, I.2 lazer@istu.ru |
| Source: | Measurement Techniques. Mar2010, Vol. 53 Issue 3, p347-349. 3p. 2 Graphs. |
| Subjects: | Surfaces (Technology), Atomic force microscopy, Nanostructured materials, Laser beams, Radiation |
| Abstract: | The possibility of obtaining smooth surfaces for glass ceramic substrates under the action of laser radiation is studied. A procedure is considered for local monitoring of ST 50-1 glass ceramic surface topology by means of a scanning probe microscope in contact and semicontact regimes before and after the action of laser radiation. [ABSTRACT FROM AUTHOR] |
| Copyright of Measurement Techniques is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 51522803 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Precise monitoring of the surface topology of ST 50-1 glass ceramic substrates. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Besogonov%2C+V%2E%22">Besogonov, V.</searchLink><relatesTo>1</relatesTo><i> besog@udman.ru</i><br /><searchLink fieldCode="AR" term="%22Skvortsova%2C+I%2E%22">Skvortsova, I.</searchLink><relatesTo>2</relatesTo><i> lazer@istu.ru</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Measurement+Techniques%22">Measurement Techniques</searchLink>. Mar2010, Vol. 53 Issue 3, p347-349. 3p. 2 Graphs. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Surfaces+%28Technology%29%22">Surfaces (Technology)</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Nanostructured+materials%22">Nanostructured materials</searchLink><br /><searchLink fieldCode="DE" term="%22Laser+beams%22">Laser beams</searchLink><br /><searchLink fieldCode="DE" term="%22Radiation%22">Radiation</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The possibility of obtaining smooth surfaces for glass ceramic substrates under the action of laser radiation is studied. A procedure is considered for local monitoring of ST 50-1 glass ceramic surface topology by means of a scanning probe microscope in contact and semicontact regimes before and after the action of laser radiation. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Measurement Techniques is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s11018-010-9508-8 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 3 StartPage: 347 Subjects: – SubjectFull: Surfaces (Technology) Type: general – SubjectFull: Atomic force microscopy Type: general – SubjectFull: Nanostructured materials Type: general – SubjectFull: Laser beams Type: general – SubjectFull: Radiation Type: general Titles: – TitleFull: Precise monitoring of the surface topology of ST 50-1 glass ceramic substrates. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Besogonov, V. – PersonEntity: Name: NameFull: Skvortsova, I. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: Mar2010 Type: published Y: 2010 Identifiers: – Type: issn-print Value: 05431972 Numbering: – Type: volume Value: 53 – Type: issue Value: 3 Titles: – TitleFull: Measurement Techniques Type: main |
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