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3-D structures of crack-tip dislocations and their shielding effect revealed by electron tomography.

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Title: 3-D structures of crack-tip dislocations and their shielding effect revealed by electron tomography.
Authors: Tanaka, Masaki1 masaki@zaiko.kyushu-u.ac.jp, Honda, Masaki1, Sadamatsu, Sunao1, Higashida, Kenji1
Source: Journal of Electron Microscopy. Aug2010 Supplement 1, Vol. 59 Issue S1, pS55-S60. 1p. 3 Black and White Photographs, 3 Diagrams.
Subjects: Dislocations in crystals, Scanning electron microscopes, Tomography, Scanning electron microscopy, Oscillations, Properties of matter
Abstract: Three-dimensional structures of crack-tip dislocations in silicon crystals have been examined by combining scanning transmission electron microscopy and computed tomography. Cracks were introduced by a Vickers hardness tester at room temperature, and the sample was heated at 823 K for 1 h in order to introduce dislocations around the crack tips. Dislocation segments cut out from loops were observed around the crack tip, the three-dimensional structure of which was characterized by using by electron tomography. Their Burgers vectors including the sings were also determined by oscillating contrasts along dislocations. In order to investigate the effect of the dislocations on fracture behaviours, local stress intensity factor due to one dislocation was calculated, which indicates the dislocations observed were shielding type to increase fracture toughness. [ABSTRACT FROM PUBLISHER]
Copyright of Journal of Electron Microscopy is the property of Oxford University Press / USA and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: 3-D structures of crack-tip dislocations and their shielding effect revealed by electron tomography.
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  Data: <searchLink fieldCode="AR" term="%22Tanaka%2C+Masaki%22">Tanaka, Masaki</searchLink><relatesTo>1</relatesTo><i> masaki@zaiko.kyushu-u.ac.jp</i><br /><searchLink fieldCode="AR" term="%22Honda%2C+Masaki%22">Honda, Masaki</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Sadamatsu%2C+Sunao%22">Sadamatsu, Sunao</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Higashida%2C+Kenji%22">Higashida, Kenji</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electron+Microscopy%22">Journal of Electron Microscopy</searchLink>. Aug2010 Supplement 1, Vol. 59 Issue S1, pS55-S60. 1p. 3 Black and White Photographs, 3 Diagrams.
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  Data: <searchLink fieldCode="DE" term="%22Dislocations+in+crystals%22">Dislocations in crystals</searchLink><br /><searchLink fieldCode="DE" term="%22Scanning+electron+microscopes%22">Scanning electron microscopes</searchLink><br /><searchLink fieldCode="DE" term="%22Tomography%22">Tomography</searchLink><br /><searchLink fieldCode="DE" term="%22Scanning+electron+microscopy%22">Scanning electron microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Oscillations%22">Oscillations</searchLink><br /><searchLink fieldCode="DE" term="%22Properties+of+matter%22">Properties of matter</searchLink>
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  Data: Three-dimensional structures of crack-tip dislocations in silicon crystals have been examined by combining scanning transmission electron microscopy and computed tomography. Cracks were introduced by a Vickers hardness tester at room temperature, and the sample was heated at 823 K for 1 h in order to introduce dislocations around the crack tips. Dislocation segments cut out from loops were observed around the crack tip, the three-dimensional structure of which was characterized by using by electron tomography. Their Burgers vectors including the sings were also determined by oscillating contrasts along dislocations. In order to investigate the effect of the dislocations on fracture behaviours, local stress intensity factor due to one dislocation was calculated, which indicates the dislocations observed were shielding type to increase fracture toughness. [ABSTRACT FROM PUBLISHER]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Electron Microscopy is the property of Oxford University Press / USA and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1093/jmicro/dfq031
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      – Code: eng
        Text: English
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        StartPage: S55
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      – SubjectFull: Dislocations in crystals
        Type: general
      – SubjectFull: Scanning electron microscopes
        Type: general
      – SubjectFull: Tomography
        Type: general
      – SubjectFull: Scanning electron microscopy
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      – SubjectFull: Oscillations
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      – SubjectFull: Properties of matter
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            NameFull: Honda, Masaki
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            NameFull: Sadamatsu, Sunao
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            – D: 02
              M: 08
              Text: Aug2010 Supplement 1
              Type: published
              Y: 2010
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            – TitleFull: Journal of Electron Microscopy
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