Performance Degradation of Pentacene-Based Organic Thin-Film Transistors Under Positive Drain Bias Stress in the Atmosphere.
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| Title: | Performance Degradation of Pentacene-Based Organic Thin-Film Transistors Under Positive Drain Bias Stress in the Atmosphere. |
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| Authors: | Ching-Lin Fan1,2 clfan@mail.ntust.edu.tw, Tsung-Hsien Yang1, Chin-Yuan Chiang1 |
| Source: | IEEE Electron Device Letters. Aug2010, Vol. 31 Issue 8, p887-889. 3p. |
| Subjects: | Thin film transistors, Electric insulators & insulation, Pentacene, Reliability (Personality trait), Electric fields |
| Abstract: | The drain bias stress effect on organic thin-film transistor (OTFT) performance degradation in the atmosphere has been investigated. The OTFTs under drain bias stress exhibit larger performance degradation than those under atmospheric stress. It is also found that the performance degradation under positive drain bias stress is larger than that under negative drain bias stress. We presume that the OTFT performance degradation under positive drain bias stress resulted from large lateral electrical field and vertical electrical field, resulting in increased trap state density (Ntrap) in the bulk channel and carrier injection into the gate insulator, respectively. [ABSTRACT FROM AUTHOR] |
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| Database: | Engineering Source |
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