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Kaolinite platelet orientation for XRD and AFM applications

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Title: Kaolinite platelet orientation for XRD and AFM applications
Authors: Żbik, Marek S.1, Raftery, Noel A.1, Smart, Roger St.C.2, Frost, Ray L.1 r.frost@qut.edu.au
Source: Applied Clay Science. Nov2010, Vol. 50 Issue 3, p299-304. 6p.
Subjects: Kaolinite, Thin films, Atomic force microscopy, X-ray diffraction, Suspensions (Chemistry), Scanning electron microscopy
Abstract: Abstract: The structure-building phenomena within clay aggregates are governed by forces acting between clay particles. The nature of such forces is important to understand in order to manipulate the aggregate structure for applications such as settling and dewatering. A parallel particle orientation is required when conducting force measurements acting between the basal planes of clay mineral platelets using atomic force microscopy (AFM). In order to prepare a film of clay particles with the optimal orientation for conducting AFM measurements, the influences of particle concentration in suspension, suspension pH and particle size on the clay platelet orientation were investigated using scanning electron microscopy (SEM) and X-ray diffraction (XRD) methods. From these investigations, we conclude that high clay (dry mass) concentrations and larger particle diameters (up to 5μm) in suspension result in random orientation of platelets on the substrate. The best possible laminar orientation in the clay dried film as represented in the XRD by the 001/020 intensity ratio of more than 150 and by SEM micrograph assessments, was obtained by drying thin layers from 0.2wt.% of−5μm clay suspensions at pH 10.5. These dried films are stable and suitable for close-approach AFM studies in solution. [Copyright &y& Elsevier]
Copyright of Applied Clay Science is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 55056314
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Kaolinite platelet orientation for XRD and AFM applications
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  Data: <searchLink fieldCode="AR" term="%22Żbik%2C+Marek+S%2E%22">Żbik, Marek S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Raftery%2C+Noel+A%2E%22">Raftery, Noel A.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Smart%2C+Roger+St%2EC%2E%22">Smart, Roger St.C.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Frost%2C+Ray+L%2E%22">Frost, Ray L.</searchLink><relatesTo>1</relatesTo><i> r.frost@qut.edu.au</i>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Clay+Science%22">Applied Clay Science</searchLink>. Nov2010, Vol. 50 Issue 3, p299-304. 6p.
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  Data: <searchLink fieldCode="DE" term="%22Kaolinite%22">Kaolinite</searchLink><br /><searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Suspensions+%28Chemistry%29%22">Suspensions (Chemistry)</searchLink><br /><searchLink fieldCode="DE" term="%22Scanning+electron+microscopy%22">Scanning electron microscopy</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Abstract: The structure-building phenomena within clay aggregates are governed by forces acting between clay particles. The nature of such forces is important to understand in order to manipulate the aggregate structure for applications such as settling and dewatering. A parallel particle orientation is required when conducting force measurements acting between the basal planes of clay mineral platelets using atomic force microscopy (AFM). In order to prepare a film of clay particles with the optimal orientation for conducting AFM measurements, the influences of particle concentration in suspension, suspension pH and particle size on the clay platelet orientation were investigated using scanning electron microscopy (SEM) and X-ray diffraction (XRD) methods. From these investigations, we conclude that high clay (dry mass) concentrations and larger particle diameters (up to 5μm) in suspension result in random orientation of platelets on the substrate. The best possible laminar orientation in the clay dried film as represented in the XRD by the 001/020 intensity ratio of more than 150 and by SEM micrograph assessments, was obtained by drying thin layers from 0.2wt.% of−5μm clay suspensions at pH 10.5. These dried films are stable and suitable for close-approach AFM studies in solution. [Copyright &y& Elsevier]
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  Data: <i>Copyright of Applied Clay Science is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1016/j.clay.2010.08.010
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 299
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      – SubjectFull: Kaolinite
        Type: general
      – SubjectFull: Thin films
        Type: general
      – SubjectFull: Atomic force microscopy
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      – SubjectFull: X-ray diffraction
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      – SubjectFull: Suspensions (Chemistry)
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      – SubjectFull: Scanning electron microscopy
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      – TitleFull: Kaolinite platelet orientation for XRD and AFM applications
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            NameFull: Raftery, Noel A.
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            NameFull: Smart, Roger St.C.
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              M: 11
              Text: Nov2010
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              Y: 2010
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