Isakozawa, S., Kaji, K., Tamura, K., Zhang, X. F., Sandborg, A., & Baba, N. (2010). The development of a new windowless XEDS detector. Journal of Electron Microscopy, 59(6), 469. https://doi.org/10.1093/jmicro/dfq026
Chicago Style (17th ed.) CitationIsakozawa, Shigeto, Kazutoshi Kaji, Keiji Tamura, Xiao Feng Zhang, Alan Sandborg, and Norio Baba. "The Development of a New Windowless XEDS Detector." Journal of Electron Microscopy 59, no. 6 (2010): 469. https://doi.org/10.1093/jmicro/dfq026.
MLA (9th ed.) CitationIsakozawa, Shigeto, et al. "The Development of a New Windowless XEDS Detector." Journal of Electron Microscopy, vol. 59, no. 6, 2010, p. 469, https://doi.org/10.1093/jmicro/dfq026.
Warning: These citations may not always be 100% accurate.