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The development of a new windowless XEDS detector.

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Title: The development of a new windowless XEDS detector.
Authors: Isakozawa, Shigeto1, Kaji, Kazutoshi1, Tamura, Keiji1, Zhang, Xiao Feng2, Sandborg, Alan3, Baba, Norio4
Source: Journal of Electron Microscopy. Dec2010, Vol. 59 Issue 6, p469-472. 4p. 1 Black and White Photograph, 3 Diagrams, 1 Chart, 2 Graphs.
Subjects: X-ray spectroscopy, Electron microscopes, Electronic probes, Signal detection, Hydrocarbons, Vacuum-gages, Analytical chemistry
Abstract: A new windowless X-ray energy-dispersive spectroscopy (XEDS) detector has been developed for an analytical electron microscope (AEM). Different from the conventional XEDS detectors, the new detector does not contain an ultra-thin window (UTW) and a vacuum gate valve which are the major causes of low X-ray detection sensitivity and vibration problems for AEM imaging, respectively. The performance of the newly designed detector was examined at an AEM column vacuum level of 10−5 Pa. The X-ray detectability was improved considerably; in particular, the sensitivity for detecting nitrogen characteristic X-ray signal was three times higher than that of the conventional UTW detectors. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Electron Microscopy is the property of Oxford University Press / USA and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: The development of a new windowless XEDS detector.
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  Data: <searchLink fieldCode="AR" term="%22Isakozawa%2C+Shigeto%22">Isakozawa, Shigeto</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Kaji%2C+Kazutoshi%22">Kaji, Kazutoshi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Tamura%2C+Keiji%22">Tamura, Keiji</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Zhang%2C+Xiao+Feng%22">Zhang, Xiao Feng</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Sandborg%2C+Alan%22">Sandborg, Alan</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Baba%2C+Norio%22">Baba, Norio</searchLink><relatesTo>4</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electron+Microscopy%22">Journal of Electron Microscopy</searchLink>. Dec2010, Vol. 59 Issue 6, p469-472. 4p. 1 Black and White Photograph, 3 Diagrams, 1 Chart, 2 Graphs.
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  Data: <searchLink fieldCode="DE" term="%22X-ray+spectroscopy%22">X-ray spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+microscopes%22">Electron microscopes</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+probes%22">Electronic probes</searchLink><br /><searchLink fieldCode="DE" term="%22Signal+detection%22">Signal detection</searchLink><br /><searchLink fieldCode="DE" term="%22Hydrocarbons%22">Hydrocarbons</searchLink><br /><searchLink fieldCode="DE" term="%22Vacuum-gages%22">Vacuum-gages</searchLink><br /><searchLink fieldCode="DE" term="%22Analytical+chemistry%22">Analytical chemistry</searchLink>
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  Data: A new windowless X-ray energy-dispersive spectroscopy (XEDS) detector has been developed for an analytical electron microscope (AEM). Different from the conventional XEDS detectors, the new detector does not contain an ultra-thin window (UTW) and a vacuum gate valve which are the major causes of low X-ray detection sensitivity and vibration problems for AEM imaging, respectively. The performance of the newly designed detector was examined at an AEM column vacuum level of 10−5 Pa. The X-ray detectability was improved considerably; in particular, the sensitivity for detecting nitrogen characteristic X-ray signal was three times higher than that of the conventional UTW detectors. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Journal of Electron Microscopy is the property of Oxford University Press / USA and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1093/jmicro/dfq026
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        Text: English
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      – SubjectFull: X-ray spectroscopy
        Type: general
      – SubjectFull: Electron microscopes
        Type: general
      – SubjectFull: Electronic probes
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      – SubjectFull: Signal detection
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      – TitleFull: The development of a new windowless XEDS detector.
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              Text: Dec2010
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