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Interferometric verification for the polarization imaging spectrometer.

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Title: Interferometric verification for the polarization imaging spectrometer.
Authors: Mu, Tingkui1, Zhang, Chunmin1, Ren, Wenyi1, Zhang, Lin1, Jian, Xiaohua1
Source: Journal of Modern Optics. Jan2011, Vol. 58 Issue 2, p154-159. 6p.
Subjects: Interferometry, Optical polarization, Spectrometers, Optical interference, Electromagnetic fields, Experimental design, Laser beams
Abstract: The optical throughput is usually attenuated by the use of two linear polarizers in a polarization imaging spectrometer. To avoid such attenuation, in some special cases to be determined, one may remove a polarizer. Theoretical formulae for different cases are derived by using the matrix representation of the polarizers, Savart plate, and random unpolarized electromagnetic beam. The theoretical and experimental results comply with the Fresnel-Arago polarization interference laws. The normal case, without removing a polarizer, adapted itself to general applications, and the abnormal case, with the fore polarizer removed, was only adapted to polarized scenes. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Modern Optics is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 57657849
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Interferometric verification for the polarization imaging spectrometer.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Modern+Optics%22">Journal of Modern Optics</searchLink>. Jan2011, Vol. 58 Issue 2, p154-159. 6p.
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  Data: <searchLink fieldCode="DE" term="%22Interferometry%22">Interferometry</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+polarization%22">Optical polarization</searchLink><br /><searchLink fieldCode="DE" term="%22Spectrometers%22">Spectrometers</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+interference%22">Optical interference</searchLink><br /><searchLink fieldCode="DE" term="%22Electromagnetic+fields%22">Electromagnetic fields</searchLink><br /><searchLink fieldCode="DE" term="%22Experimental+design%22">Experimental design</searchLink><br /><searchLink fieldCode="DE" term="%22Laser+beams%22">Laser beams</searchLink>
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  Data: The optical throughput is usually attenuated by the use of two linear polarizers in a polarization imaging spectrometer. To avoid such attenuation, in some special cases to be determined, one may remove a polarizer. Theoretical formulae for different cases are derived by using the matrix representation of the polarizers, Savart plate, and random unpolarized electromagnetic beam. The theoretical and experimental results comply with the Fresnel-Arago polarization interference laws. The normal case, without removing a polarizer, adapted itself to general applications, and the abnormal case, with the fore polarizer removed, was only adapted to polarized scenes. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Journal of Modern Optics is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1080/09500340.2010.547621
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 154
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      – SubjectFull: Interferometry
        Type: general
      – SubjectFull: Optical polarization
        Type: general
      – SubjectFull: Spectrometers
        Type: general
      – SubjectFull: Optical interference
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      – SubjectFull: Electromagnetic fields
        Type: general
      – SubjectFull: Experimental design
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      – SubjectFull: Laser beams
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      – TitleFull: Interferometric verification for the polarization imaging spectrometer.
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            NameFull: Mu, Tingkui
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            NameFull: Ren, Wenyi
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            NameFull: Zhang, Lin
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              Text: Jan2011
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