Switch-level emulation of strength-base soft error detection
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| Title: | Switch-level emulation of strength-base soft error detection |
|---|---|
| Authors: | Sedaghat, Reza rsedagha@ee.ryerson.ca, Javaheri, Reza1, Kalkat, Prabhleen K.1, Chikhe, Jalal Mohammad1 |
| Source: | Microelectronics Reliability. Mar2011, Vol. 51 Issue 3, p692-702. 11p. |
| Subjects: | Switching circuits, Strength of materials, Errors, Simulation methods & models, Field programmable gate arrays, Transistor circuits |
| Abstract: | Abstract: Modern nanometer circuits have become more prone to soft errors necessitating faster and more reliable error detection techniques. Simulation-based soft error detection has been popular but is limited by its inability to handle complex circuits and high run-time. FPGA-based soft error detection methods can be effectively used to overcome the speed limitation of simulation as well as handle circuits with much higher complexity. The paper presents a novel strength-based soft error emulation method targeting soft errors caused by transient pulses of magnitude less than logic threshold. The impact of transient injection location on soft error coverage is analyzed and the idea of using drain of a transistor as transient injection location is presented. Furthermore, the concept of transient equivalence is applied to minimize resource overhead as well as speed-up soft error detection process. Advanced switch-level models are designed using gate-level structure and used to implement switch-level equivalents of ISCAS’85 benchmarks. The experimental results reported for ISCAS’85 benchmarks show that an average soft error coverage of 0.7–0.8 was achieved using the proposed strength-based detection with drain as transient injection location. The application of transient equivalence resulted in speed-up of emulation by 2.875 and reduced the memory utilization by 65%. The emulation-based soft error detection achieved significant speed-up of the order of 106 as compared to a customized simulation-based method. [Copyright &y& Elsevier] |
| Copyright of Microelectronics Reliability is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 58542720 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Switch-level emulation of strength-base soft error detection – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Sedaghat%2C+Reza%22">Sedaghat, Reza</searchLink><i> rsedagha@ee.ryerson.ca</i><br /><searchLink fieldCode="AR" term="%22Javaheri%2C+Reza%22">Javaheri, Reza</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Kalkat%2C+Prabhleen+K%2E%22">Kalkat, Prabhleen K.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Chikhe%2C+Jalal+Mohammad%22">Chikhe, Jalal Mohammad</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Microelectronics+Reliability%22">Microelectronics Reliability</searchLink>. Mar2011, Vol. 51 Issue 3, p692-702. 11p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Switching+circuits%22">Switching circuits</searchLink><br /><searchLink fieldCode="DE" term="%22Strength+of+materials%22">Strength of materials</searchLink><br /><searchLink fieldCode="DE" term="%22Errors%22">Errors</searchLink><br /><searchLink fieldCode="DE" term="%22Simulation+methods+%26+models%22">Simulation methods & models</searchLink><br /><searchLink fieldCode="DE" term="%22Field+programmable+gate+arrays%22">Field programmable gate arrays</searchLink><br /><searchLink fieldCode="DE" term="%22Transistor+circuits%22">Transistor circuits</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Abstract: Modern nanometer circuits have become more prone to soft errors necessitating faster and more reliable error detection techniques. Simulation-based soft error detection has been popular but is limited by its inability to handle complex circuits and high run-time. FPGA-based soft error detection methods can be effectively used to overcome the speed limitation of simulation as well as handle circuits with much higher complexity. The paper presents a novel strength-based soft error emulation method targeting soft errors caused by transient pulses of magnitude less than logic threshold. The impact of transient injection location on soft error coverage is analyzed and the idea of using drain of a transistor as transient injection location is presented. Furthermore, the concept of transient equivalence is applied to minimize resource overhead as well as speed-up soft error detection process. Advanced switch-level models are designed using gate-level structure and used to implement switch-level equivalents of ISCAS’85 benchmarks. The experimental results reported for ISCAS’85 benchmarks show that an average soft error coverage of 0.7–0.8 was achieved using the proposed strength-based detection with drain as transient injection location. The application of transient equivalence resulted in speed-up of emulation by 2.875 and reduced the memory utilization by 65%. The emulation-based soft error detection achieved significant speed-up of the order of 106 as compared to a customized simulation-based method. [Copyright &y& Elsevier] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Microelectronics Reliability is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.microrel.2010.10.007 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 692 Subjects: – SubjectFull: Switching circuits Type: general – SubjectFull: Strength of materials Type: general – SubjectFull: Errors Type: general – SubjectFull: Simulation methods & models Type: general – SubjectFull: Field programmable gate arrays Type: general – SubjectFull: Transistor circuits Type: general Titles: – TitleFull: Switch-level emulation of strength-base soft error detection Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Sedaghat, Reza – PersonEntity: Name: NameFull: Javaheri, Reza – PersonEntity: Name: NameFull: Kalkat, Prabhleen K. – PersonEntity: Name: NameFull: Chikhe, Jalal Mohammad IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: Mar2011 Type: published Y: 2011 Identifiers: – Type: issn-print Value: 00262714 Numbering: – Type: volume Value: 51 – Type: issue Value: 3 Titles: – TitleFull: Microelectronics Reliability Type: main |
| ResultId | 1 |
