On the selection of software defect estimation techniques.
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| Title: | On the selection of software defect estimation techniques. |
|---|---|
| Authors: | Cangussu, João W.1 cangussu@utdallas.edu, Haider, Syed W.1, Cooper, Kendra1, Baron, Michael2 |
| Source: | Software Testing: Verification & Reliability. Jun2011, Vol. 21 Issue 2, p125-152. 35p. 6 Diagrams, 11 Charts, 1 Graph. |
| Subjects: | Estimation theory, Defect correction methods (Numerical analysis), Capability maturity model, Decision making, Methodology |
| Abstract: | Estimating the number of defects in a software product is an important and challenging problem. A multitude of estimation techniques have been proposed for defect prediction. However, not all techniques are applicable in all cases. The selection of the proper approach to use depends on multiple factors: the features of the approach; the availability of resources; and the goals for using the estimated defect data. In this paper a survey of existing estimation techniques and a decision support approach for selecting the most suitable defect estimation technique for a project, with specific goals, is proposed. The results of the ranking are a clear indication that no estimation technique provides a single, comprehensive solution; the selection must be done according to a given scenario. Copyright © 2009 John Wiley & Sons, Ltd. The paper presents a mathematical and a practical characterization of existing defect estimation techniques. A methodology based on the Analytic Hierarchy Process (AHP), a Multi-Criteria Decision Making (MCDM) approach, is used to rank the existing techniques under different scenarios according to their specified characterization. The scenarios presented in the paper are derived from the process maturity levels defined in the Capability Maturity Model (CMM), but the approach can be used with any specified scenario. It is clear that no estimation technique provides a comprehensive solution and the 'best' choice depends on the given scenario. Copyright © 2009 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR] |
| Copyright of Software Testing: Verification & Reliability is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 60647253 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: On the selection of software defect estimation techniques. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Cangussu%2C+João+W%2E%22">Cangussu, João W.</searchLink><relatesTo>1</relatesTo><i> cangussu@utdallas.edu</i><br /><searchLink fieldCode="AR" term="%22Haider%2C+Syed+W%2E%22">Haider, Syed W.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Cooper%2C+Kendra%22">Cooper, Kendra</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Baron%2C+Michael%22">Baron, Michael</searchLink><relatesTo>2</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Software+Testing%3A+Verification+%26+Reliability%22">Software Testing: Verification & Reliability</searchLink>. Jun2011, Vol. 21 Issue 2, p125-152. 35p. 6 Diagrams, 11 Charts, 1 Graph. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Estimation+theory%22">Estimation theory</searchLink><br /><searchLink fieldCode="DE" term="%22Defect+correction+methods+%28Numerical+analysis%29%22">Defect correction methods (Numerical analysis)</searchLink><br /><searchLink fieldCode="DE" term="%22Capability+maturity+model%22">Capability maturity model</searchLink><br /><searchLink fieldCode="DE" term="%22Decision+making%22">Decision making</searchLink><br /><searchLink fieldCode="DE" term="%22Methodology%22">Methodology</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Estimating the number of defects in a software product is an important and challenging problem. A multitude of estimation techniques have been proposed for defect prediction. However, not all techniques are applicable in all cases. The selection of the proper approach to use depends on multiple factors: the features of the approach; the availability of resources; and the goals for using the estimated defect data. In this paper a survey of existing estimation techniques and a decision support approach for selecting the most suitable defect estimation technique for a project, with specific goals, is proposed. The results of the ranking are a clear indication that no estimation technique provides a single, comprehensive solution; the selection must be done according to a given scenario. Copyright © 2009 John Wiley & Sons, Ltd. The paper presents a mathematical and a practical characterization of existing defect estimation techniques. A methodology based on the Analytic Hierarchy Process (AHP), a Multi-Criteria Decision Making (MCDM) approach, is used to rank the existing techniques under different scenarios according to their specified characterization. The scenarios presented in the paper are derived from the process maturity levels defined in the Capability Maturity Model (CMM), but the approach can be used with any specified scenario. It is clear that no estimation technique provides a comprehensive solution and the 'best' choice depends on the given scenario. Copyright © 2009 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Software Testing: Verification & Reliability is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/stvr.419 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 35 StartPage: 125 Subjects: – SubjectFull: Estimation theory Type: general – SubjectFull: Defect correction methods (Numerical analysis) Type: general – SubjectFull: Capability maturity model Type: general – SubjectFull: Decision making Type: general – SubjectFull: Methodology Type: general Titles: – TitleFull: On the selection of software defect estimation techniques. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Cangussu, João W. – PersonEntity: Name: NameFull: Haider, Syed W. – PersonEntity: Name: NameFull: Cooper, Kendra – PersonEntity: Name: NameFull: Baron, Michael IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: Jun2011 Type: published Y: 2011 Identifiers: – Type: issn-print Value: 09600833 Numbering: – Type: volume Value: 21 – Type: issue Value: 2 Titles: – TitleFull: Software Testing: Verification & Reliability Type: main |
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