APA (7th ed.) Citation

Rodriguez, N., Cristoloveanu, S., Maqueda, M., Gámiz, F., & Allibert, F. (2011). Three-interface pseudo-MOSFET models for the characterization of SOI wafers with ultrathin film and BOX. Microelectronic Engineering, 88(7), 1236. https://doi.org/10.1016/j.mee.2011.03.082

Chicago Style (17th ed.) Citation

Rodriguez, Noel, Sorin Cristoloveanu, Mariazel Maqueda, Francisco Gámiz, and Frederic Allibert. "Three-interface Pseudo-MOSFET Models for the Characterization of SOI Wafers with Ultrathin Film and BOX." Microelectronic Engineering 88, no. 7 (2011): 1236. https://doi.org/10.1016/j.mee.2011.03.082.

MLA (9th ed.) Citation

Rodriguez, Noel, et al. "Three-interface Pseudo-MOSFET Models for the Characterization of SOI Wafers with Ultrathin Film and BOX." Microelectronic Engineering, vol. 88, no. 7, 2011, p. 1236, https://doi.org/10.1016/j.mee.2011.03.082.