APA (7th ed.) Citation

Sadewasser, S., Abou-Ras, D., Azulay, D., Baier, R., Balberg, I., Cahen, D., . . . Unold, T. (2011). Nanometer-scale electronic and microstructural properties of grain boundaries in Cu(In,Ga)Se2. Thin Solid Films, 519(21), 7341. https://doi.org/10.1016/j.tsf.2010.12.227

Chicago Style (17th ed.) Citation

Sadewasser, S., et al. "Nanometer-scale Electronic and Microstructural Properties of Grain Boundaries in Cu(In,Ga)Se2." Thin Solid Films 519, no. 21 (2011): 7341. https://doi.org/10.1016/j.tsf.2010.12.227.

MLA (9th ed.) Citation

Sadewasser, S., et al. "Nanometer-scale Electronic and Microstructural Properties of Grain Boundaries in Cu(In,Ga)Se2." Thin Solid Films, vol. 519, no. 21, 2011, p. 7341, https://doi.org/10.1016/j.tsf.2010.12.227.