APA (7th ed.) Citation

Mahmud, M. I., Celik-Butler, Z., Hao, P., Srinivasan, P., Hou, F., Amey, B. L., & Pendharkar, S. (2012). Effect of Stress-Induced Degradation in LDMOS \1/f Noise Characteristics. IEEE Electron Device Letters, 33(1), 107. https://doi.org/10.1109/LED.2011.2171473

Chicago Style (17th ed.) Citation

Mahmud, M. I., Z. Celik-Butler, P. Hao, P. Srinivasan, F. Hou, B. L. Amey, and S. Pendharkar. "Effect of Stress-Induced Degradation in LDMOS \1/f Noise Characteristics." IEEE Electron Device Letters 33, no. 1 (2012): 107. https://doi.org/10.1109/LED.2011.2171473.

MLA (9th ed.) Citation

Mahmud, M. I., et al. "Effect of Stress-Induced Degradation in LDMOS \1/f Noise Characteristics." IEEE Electron Device Letters, vol. 33, no. 1, 2012, p. 107, https://doi.org/10.1109/LED.2011.2171473.