Comfort, E. S., Fishman, M., Malapanis, A., Hughes, H., McMarr, P., Cress, C. D., . . . Lee, J. U. (2011). Creation of Individual Defects at Extremely High Proton Fluences in Carbon Nanotube p-n Diodes. IEEE Transactions on Nuclear Science, 58(6), 2898. https://doi.org/10.1109/TNS.2011.2170708
Chicago Style (17th ed.) CitationComfort, Everett S., Matthew Fishman, Argyrios Malapanis, Harold Hughes, Patrick McMarr, Cory D. Cress, Hassaram Bakhru, and Ji Ung Lee. "Creation of Individual Defects at Extremely High Proton Fluences in Carbon Nanotube P-n Diodes." IEEE Transactions on Nuclear Science 58, no. 6 (2011): 2898. https://doi.org/10.1109/TNS.2011.2170708.
MLA (9th ed.) CitationComfort, Everett S., et al. "Creation of Individual Defects at Extremely High Proton Fluences in Carbon Nanotube P-n Diodes." IEEE Transactions on Nuclear Science, vol. 58, no. 6, 2011, p. 2898, https://doi.org/10.1109/TNS.2011.2170708.