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Molecular Self-Assembly of Sulfonated Polyaniline Thin Films.

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Title: Molecular Self-Assembly of Sulfonated Polyaniline Thin Films.
Authors: Sim, W. S., Goh, F. Y.
Source: Surface Review & Letters. Oct2001, Vol. 8 Issue 5, p491. 6p.
Subjects: Thin films, Polymers, Molecular self-assembly
Abstract: Multilayer polymer thin films with well-defined molecular architectures have been fabricated by an electrostatic self-assembly process involving sequential exposure of glass substrates to polyelectrolyte solutions of sulfonated polyaniline and hexadimethrine bromide. Ultraviolet-Visible (UV-Vis) Spectroscopy indicates layer-by-layer growth of alternating monolayers of oppositely charged polymer chains whose structural integrity is verified by X-ray Photoelectron Spectroscopy (XPS). The surface roughness is measured to be ∼3 nm by Atomic Force Microscopy (AFM). The potential applications of these films in optoelectronic devices are discussed. [ABSTRACT FROM AUTHOR]
Copyright of Surface Review & Letters is the property of World Scientific Publishing Company and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
An: 7145956
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Multilayer polymer thin films with well-defined molecular architectures have been fabricated by an electrostatic self-assembly process involving sequential exposure of glass substrates to polyelectrolyte solutions of sulfonated polyaniline and hexadimethrine bromide. Ultraviolet-Visible (UV-Vis) Spectroscopy indicates layer-by-layer growth of alternating monolayers of oppositely charged polymer chains whose structural integrity is verified by X-ray Photoelectron Spectroscopy (XPS). The surface roughness is measured to be ∼3 nm by Atomic Force Microscopy (AFM). The potential applications of these films in optoelectronic devices are discussed. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Surface Review & Letters is the property of World Scientific Publishing Company and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1142/S0218625X01001348
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        Text: English
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              Text: Oct2001
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