Bibliographic Details
| Title: |
Effects of Mn doping on structural and dielectric properties of sol–gel-derived (Ba0.835Ca0.165)(Zr0.09Ti0.91)O3 thin films |
| Authors: |
Lin, Yanting1, Miao, Xinrui2, Qin, Ni1, Zhou, Hong1, Deng, Wenli2, Bao, Dinghua1 stsbdh@mail.sysu.edu.cn |
| Source: |
Thin Solid Films. Jun2012, Vol. 520 Issue 16, p5146-5150. 5p. |
| Subjects: |
Titanium oxides, Thin films, Electric properties of metals, Sol-gel processes, Scanning electron microscopy, Microwave devices, Particle size distribution |
| Abstract: |
Abstract: We reported the effects of Mn doping on the structure and dielectric properties of (Ba0.835Ca0.165)(Zr0.09Ti0.91)O3 (BCZT) thin films prepared by sol–gel method. The (Ba0.835Ca0.165)Mnx(Zr0.09Ti0.91)1−xO3 (x=0, 0.002, 0.005, and 0.01) thin films exhibited a pure pseudo-cubic perovskite structure with random orientation. Scanning electron microscopy and atomic force microscopy observation showed that increasing Mn-doping amount caused a decrease in particle size and a cluster of the particles, while the film surface remained smooth and crack-free. Compared with the undoped film, Mn doped BCZT thin films exhibited smaller dielectric constant and lower dielectric loss. The figure of merit reached the maximum value of 16.7 with a tunability of 53.6% for the film with 0.5mol% Mn doping, when a bias electric field of 400kV/cm was applied at 100kHz. The results indicated that the Mn doped BCZT thin films are suitable for tunable microwave device applications. [Copyright &y& Elsevier] |
|
Copyright of Thin Solid Films is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Engineering Source |