Surface contributions to the XPS spectra of nanostructured NiO deposited on HOPG

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Title: Surface contributions to the XPS spectra of nanostructured NiO deposited on HOPG
Authors: Preda, I.1, Mossanek, R.J.O.2, Abbate, M.2, Alvarez, L.3, Méndez, J.3, Gutiérrez, A.1, Soriano, L.1 l.soriano@uam.es
Source: Surface Science. Sep2012, Vol. 606 Issue 17/18, p1426-1430. 5p.
Subjects: Nanostructured materials, Nickel oxides, Graphite, Surfaces (Technology), X-ray photoelectron spectroscopy, Atomic force microscopy, Scientific observation
Abstract: Abstract: In this work we present an in situ X-ray photoelectron spectroscopy (XPS) study of the growth of NiO on highly ordered pyrolitic graphite (HOPG). The XPS spectra were measured as a function of the equivalent NiO coverage. Also, ex-situ atomic force microscopy (AFM) images were taken for some of these stages in order to follow the morphology of the NiO deposits. For low coverages the lineshapes of the Ni 2p spectra differ strongly from those of bulk NiO. This has been related to the large surface contribution. The O 1s XPS spectra also show a surface related structure which follows the same trend observed in the Ni 2p spectra. [Copyright &y& Elsevier]
Copyright of Surface Science is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Surface contributions to the XPS spectra of nanostructured NiO deposited on HOPG
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  Data: <searchLink fieldCode="AR" term="%22Preda%2C+I%2E%22">Preda, I.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Mossanek%2C+R%2EJ%2EO%2E%22">Mossanek, R.J.O.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Abbate%2C+M%2E%22">Abbate, M.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Alvarez%2C+L%2E%22">Alvarez, L.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Méndez%2C+J%2E%22">Méndez, J.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Gutiérrez%2C+A%2E%22">Gutiérrez, A.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Soriano%2C+L%2E%22">Soriano, L.</searchLink><relatesTo>1</relatesTo><i> l.soriano@uam.es</i>
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  Data: <searchLink fieldCode="JN" term="%22Surface+Science%22">Surface Science</searchLink>. Sep2012, Vol. 606 Issue 17/18, p1426-1430. 5p.
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  Data: <searchLink fieldCode="DE" term="%22Nanostructured+materials%22">Nanostructured materials</searchLink><br /><searchLink fieldCode="DE" term="%22Nickel+oxides%22">Nickel oxides</searchLink><br /><searchLink fieldCode="DE" term="%22Graphite%22">Graphite</searchLink><br /><searchLink fieldCode="DE" term="%22Surfaces+%28Technology%29%22">Surfaces (Technology)</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+photoelectron+spectroscopy%22">X-ray photoelectron spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Scientific+observation%22">Scientific observation</searchLink>
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  Data: Abstract: In this work we present an in situ X-ray photoelectron spectroscopy (XPS) study of the growth of NiO on highly ordered pyrolitic graphite (HOPG). The XPS spectra were measured as a function of the equivalent NiO coverage. Also, ex-situ atomic force microscopy (AFM) images were taken for some of these stages in order to follow the morphology of the NiO deposits. For low coverages the lineshapes of the Ni 2p spectra differ strongly from those of bulk NiO. This has been related to the large surface contribution. The O 1s XPS spectra also show a surface related structure which follows the same trend observed in the Ni 2p spectra. [Copyright &y& Elsevier]
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  Data: <i>Copyright of Surface Science is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.susc.2012.05.005
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      – Code: eng
        Text: English
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      – SubjectFull: Nanostructured materials
        Type: general
      – SubjectFull: Nickel oxides
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      – SubjectFull: Graphite
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      – SubjectFull: Surfaces (Technology)
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      – SubjectFull: Atomic force microscopy
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      – SubjectFull: Scientific observation
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      – TitleFull: Surface contributions to the XPS spectra of nanostructured NiO deposited on HOPG
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              Text: Sep2012
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              Y: 2012
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