APA (7th ed.) Citation

Yurchenko, V., & Yurchenko, N. (2012). Nondestructive testing of the thermal resistance of Gann diodes during their manufacture. Russian Journal of Nondestructive Testing, 48(4), 250. https://doi.org/10.1134/S1061830912040109

Chicago Style (17th ed.) Citation

Yurchenko, V., and N. Yurchenko. "Nondestructive Testing of the Thermal Resistance of Gann Diodes During Their Manufacture." Russian Journal of Nondestructive Testing 48, no. 4 (2012): 250. https://doi.org/10.1134/S1061830912040109.

MLA (9th ed.) Citation

Yurchenko, V., and N. Yurchenko. "Nondestructive Testing of the Thermal Resistance of Gann Diodes During Their Manufacture." Russian Journal of Nondestructive Testing, vol. 48, no. 4, 2012, p. 250, https://doi.org/10.1134/S1061830912040109.