Nondestructive testing of the thermal resistance of Gann diodes during their manufacture.
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| Title: | Nondestructive testing of the thermal resistance of Gann diodes during their manufacture. |
|---|---|
| Authors: | Yurchenko, V.1, Yurchenko, N.1 yur_med@mail.ru |
| Source: | Russian Journal of Nondestructive Testing. Apr2012, Vol. 48 Issue 4, p250-254. 5p. |
| Abstract: | The results of an investigation of the thermal resistance of Gunn diodes at different process technology cycles of their manufacturing are considered. [ABSTRACT FROM AUTHOR] |
| Copyright of Russian Journal of Nondestructive Testing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 78065244 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Nondestructive testing of the thermal resistance of Gann diodes during their manufacture. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Yurchenko%2C+V%2E%22">Yurchenko, V.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Yurchenko%2C+N%2E%22">Yurchenko, N.</searchLink><relatesTo>1</relatesTo><i> yur_med@mail.ru</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Russian+Journal+of+Nondestructive+Testing%22">Russian Journal of Nondestructive Testing</searchLink>. Apr2012, Vol. 48 Issue 4, p250-254. 5p. – Name: Abstract Label: Abstract Group: Ab Data: The results of an investigation of the thermal resistance of Gunn diodes at different process technology cycles of their manufacturing are considered. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Russian Journal of Nondestructive Testing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=78065244 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1134/S1061830912040109 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 5 StartPage: 250 Titles: – TitleFull: Nondestructive testing of the thermal resistance of Gann diodes during their manufacture. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Yurchenko, V. – PersonEntity: Name: NameFull: Yurchenko, N. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: Apr2012 Type: published Y: 2012 Identifiers: – Type: issn-print Value: 10618309 Numbering: – Type: volume Value: 48 – Type: issue Value: 4 Titles: – TitleFull: Russian Journal of Nondestructive Testing Type: main |
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