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Refractive index dispersion and anisotropy in Cr4+:Mg2SiO4

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Title: Refractive index dispersion and anisotropy in Cr4+:Mg2SiO4
Authors: Burshtein, Z.1 zeevb@bgumail.bgu.ac.il, Shimony, Y.2
Source: Optical Materials. Sep2002, Vol. 20 Issue 2, p87. 10p.
Subjects: Refractive index, Forsterite, Dispersion (Chemistry)
Abstract: Room-temperature refractive index dispersion and anisotropy were measured in the orthorhombic Cr4+:Mg2SiO4 (Cr4+:forsterite) single crystal between 300 and 2000 nm. Use was made of bireflection in an oriented single crystal prism and of birefringence modulation in an oriented plane-parallel sample for obtaining accurate measurements of the anisotropy. Minimum-deviation measurement in an oriented prism provided the refractive index dispersion for one of the axes, whence for the other two axes as well. The crystal is biaxial, and its dielectric principal axes X, Y, and Z, coincide with the crystallographic b, a, and c axes, respectively. Taking 632.8 nm (the HeNe laser line) as a representative wavelength of the visible range, the refractive indices would be na=1.6505±0.0005, nb=1.6365±0.0006, and nc=1.6685±0.0006. The dispersion curves were fitted to different Sellemeier functions. Our results would be very useful for the design of compensating elements of group-velocity dispersion in Cr4+:Mg2SiO4 short-pulse laser cavities. [Copyright &y& Elsevier]
Copyright of Optical Materials is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 7870459
AccessLevel: 6
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PubTypeId: academicJournal
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IllustrationInfo
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  Data: Refractive index dispersion and anisotropy in Cr<f><superscript>4+</superscript></f>:Mg<f><subscript>2</subscript></f>SiO<f><subscript>4</subscript></f>
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  Data: <searchLink fieldCode="AR" term="%22Burshtein%2C+Z%2E%22">Burshtein, Z.</searchLink><relatesTo>1</relatesTo><i> zeevb@bgumail.bgu.ac.il</i><br /><searchLink fieldCode="AR" term="%22Shimony%2C+Y%2E%22">Shimony, Y.</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Optical+Materials%22">Optical Materials</searchLink>. Sep2002, Vol. 20 Issue 2, p87. 10p.
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  Data: <searchLink fieldCode="DE" term="%22Refractive+index%22">Refractive index</searchLink><br /><searchLink fieldCode="DE" term="%22Forsterite%22">Forsterite</searchLink><br /><searchLink fieldCode="DE" term="%22Dispersion+%28Chemistry%29%22">Dispersion (Chemistry)</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Room-temperature refractive index dispersion and anisotropy were measured in the orthorhombic Cr<f>4+</f>:Mg<f>2</f>SiO<f>4</f> (Cr<f>4+</f>:forsterite) single crystal between 300 and 2000 nm. Use was made of bireflection in an oriented single crystal prism and of birefringence modulation in an oriented plane-parallel sample for obtaining accurate measurements of the anisotropy. Minimum-deviation measurement in an oriented prism provided the refractive index dispersion for one of the axes, whence for the other two axes as well. The crystal is biaxial, and its dielectric principal axes X, Y, and Z, coincide with the crystallographic b, a, and c axes, respectively. Taking 632.8 nm (the HeNe laser line) as a representative wavelength of the visible range, the refractive indices would be <f>na=1.6505±0.0005</f>, <f>nb=1.6365±0.0006</f>, and <f>nc=1.6685±0.0006</f>. The dispersion curves were fitted to different Sellemeier functions. Our results would be very useful for the design of compensating elements of group-velocity dispersion in Cr<f>4+</f>:Mg<f>2</f>SiO<f>4</f> short-pulse laser cavities. [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Optical Materials is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – Type: doi
        Value: 10.1016/S0925-3467(02)00050-2
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 10
        StartPage: 87
    Subjects:
      – SubjectFull: Refractive index
        Type: general
      – SubjectFull: Forsterite
        Type: general
      – SubjectFull: Dispersion (Chemistry)
        Type: general
    Titles:
      – TitleFull: Refractive index dispersion and anisotropy in Cr<f>4+</f>:Mg<f>2</f>SiO<f>4</f>
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            NameFull: Burshtein, Z.
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            NameFull: Shimony, Y.
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            – D: 01
              M: 09
              Text: Sep2002
              Type: published
              Y: 2002
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              Value: 20
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            – TitleFull: Optical Materials
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