Closed-form solution for a mode-III interfacial edge crack between two bonded dissimilar elastic strips

Saved in:
Bibliographic Details
Title: Closed-form solution for a mode-III interfacial edge crack between two bonded dissimilar elastic strips
Authors: Wu, Xiang-Fa xfwu@unlserve.unl.edu, Dzenis, Yuris A.1
Source: Mechanics Research Communications. Sep2002, Vol. 29 Issue 5, p407. 6p.
Subjects: Dynamics, Strains & stresses (Mechanics)
Abstract: A closed-form solution is obtained for the problem of a mode-III interfacial edge crack between two bonded semi-infinite dissimilar elastic strips. A general out-of-plane displacement potential for the crack interacting with a screw dislocation or a line force is constructed using conformal mapping technique and existing dislocation solutions. Based on this displacement potential, the stress intensity factor (SIF, KIII) and the energy release rate (ERR, GIII) for the interfacial edge crack are obtained explicitly. It is shown that, in the limiting special cases, the obtained results coincide with the results available in the literature. The present solution can be used as the Green’s function to analyze interfacial edge cracks subjected to arbitrary anti-plane loadings. As an example, a formula is derived correcting the beam theory used in evaluation of SIF (KIII) and ERR (GIII) of bimaterials in the double cantilever beam (DCB) test configuration. [Copyright &y& Elsevier]
Copyright of Mechanics Research Communications is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
Be the first to leave a comment!
You must be logged in first