Defect detection in periodic patterns using a multi-band-pass filter.

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Bibliographic Details
Title:	Defect detection in periodic patterns using a multi-band-pass filter.
Authors:	Tsai, Zong-Da zdtsai@msn.com, Perng, Ming-Hwei¹
Source:	Machine Vision & Applications. Apr2013, Vol. 24 Issue 3, p551-565. 15p. 8 Black and White Photographs, 1 Diagram, 7 Charts, 1 Graph.
Subjects:	Image processing, Optical quality control, Automation, Mathematical convolutions, Filters (Mathematics)
Abstract:	This study presents a rapid and reliable technique for the inspection of defects in a two-dimensional periodic image using a multi-band-pass filter. More importantly, the blurring effect of the resultant defect images is significantly reduced, thereby resulting in a more precise estimation of the size of defects when compared with methods that use low-pass filtering. As a filter-based approach, the present technique does not require an alignment procedure. In addition, computational time is reduced by implementing multi-band-pass filters with convolution masks when the filters are operated in the spatial domain. Further, this approach involves mostly addition operations with very few multiplications; hence, computational time is significantly reduced when compared with those for existing approaches. The efficiency and effectiveness of the proposed multi-band-pass filter is verified through examples. It is observed that there is a significant reduction in blurring effects, leakage effects, and computational effort. It is noteworthy that though the proposed approach is presented as a two-dimensional filtering problem, it can be reduced to a one-dimensional filtering problem under the assumption that the misorientation angle of the inspected periodic pattern is negligibly small. [ABSTRACT FROM AUTHOR]
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Database:	Engineering Source

Description
Abstract:	This study presents a rapid and reliable technique for the inspection of defects in a two-dimensional periodic image using a multi-band-pass filter. More importantly, the blurring effect of the resultant defect images is significantly reduced, thereby resulting in a more precise estimation of the size of defects when compared with methods that use low-pass filtering. As a filter-based approach, the present technique does not require an alignment procedure. In addition, computational time is reduced by implementing multi-band-pass filters with convolution masks when the filters are operated in the spatial domain. Further, this approach involves mostly addition operations with very few multiplications; hence, computational time is significantly reduced when compared with those for existing approaches. The efficiency and effectiveness of the proposed multi-band-pass filter is verified through examples. It is observed that there is a significant reduction in blurring effects, leakage effects, and computational effort. It is noteworthy that though the proposed approach is presented as a two-dimensional filtering problem, it can be reduced to a one-dimensional filtering problem under the assumption that the misorientation angle of the inspected periodic pattern is negligibly small. [ABSTRACT FROM AUTHOR]
ISSN:	09328092
DOI:	10.1007/s00138-012-0425-5