Bibliographic Details
| Title: |
Quantitative determination of defocus, thickness and composition from high-resolution transmission electron microscopy lattice images. |
| Authors: |
Stenkamp, D., Strunk, H. P. |
| Source: |
Applied Physics A: Materials Science & Processing. 1996, Vol. 62 Issue 4, p369. 4p. |
| Subjects: |
Crystal lattices, Crystals, Transmission electron microscopy |
| Abstract: |
A quantitative method for the direct determination of defocus Δf, local thickness t and local composition x from high-resolution transmission electron microscopy lattice images of wedge-shaped crystal samples is proposed. The method relies on the analytically derived relation between the first-order linear and nonlinear image Fourier coefficients J[sub 1] and J[sub 2] on Δf, t and x. By plotting J[sub 1] vs J[sub 2] for varying t, ellipses with defocus- and composition-specific geometry are obtained. By reconstructing the appropriate ellipse for image regions of homogeneous composition, Δf and t can be determined independently. At interfaces, local compositions x can be determined within the full range 0≤x≤1 by utilizing systematic variations of the ellipse’s geometry with varying x. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |
